SCHEMBL5409968

SCHEMBL5409968

O=C1C2CC3(O)CC1CC(O)(C2)C3

nearest known ligand 0.38

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
EPHX2 P34913 1/20 0.33
PKM P14618 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8581404 0.84
SCHEMBL8584647 0.84
SCHEMBL8581708 0.84
SCHEMBL7005961 0.80 HSD11B1 (0.34) EPHX2PKM
SCHEMBL5194001 0.72 PTPN1 (0.33)
Idramantone SCHEMBL3506706 0.72 EPHX2 (0.52) EPHX2PKM
Idramantone SCHEMBL61676 0.72 EPHX2 (0.52) EPHX2PKM
Idramantone SCHEMBL3506711 0.72 EPHX2 (0.52) EPHX2PKM
Idramantone SCHEMBL12496961 0.72 EPHX2 (0.52) EPHX2PKM
SCHEMBL5407456 0.67 EPHX2 (0.34) EPHX2PKM

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 28 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7163781-B2 Process for producing a semiconductor device KABUSHIKI KAISHA TOSHIBA (JP) 2007-01-16 US disclosed
US-7119156-B2 Resist resin KABUSHIKI KAISHA TOSHIBA (JP) 2006-10-10 US disclosed
US-7070905-B2 Pattern forming process KABUSHIKI KAISHA TOSHIBA (JP) 2006-07-04 US disclosed
US-7063932-B2 Resist resin KABUSHIKI KAISHA TOSHIBA (JP) 2006-06-20 US disclosed
US-7029823-B2 Resist composition KABUSHIKI KAISHA TOSHIBA (JP) 2006-04-18 US disclosed
US-20050048400-A1 Resist resin KABUSHIKI KAISHA TOSHIBA (JP) 2005-03-03 US disclosed
US-20050037283-A1 Resist resin KABUSHIKI KAISHA TOSHIBA (JP) 2005-02-17 US disclosed
US-20050037284-A1 Polymer; radiation transparent pattern against short wavelengths and etching resistance; semiconductors KABUSHIKI KAISHA TOSHIBA (JP) 2005-02-17 US disclosed
US-20050031990-A1 Pattern forming process KABUSHIKI KAISHA TOSHIBA (JP) 2005-02-10 US disclosed
US-20050031991-A1 Process for producing a semiconductor device KABUSHIKI KAISHA TOSHIBA (JP) 2005-02-10 US disclosed
US-6303266-B1 FOR PATTERN HAVING TRANSPARENCY AGAINST SHORT-WAVELENGTH LIGHT AND DRY-ETCHING RESISTANCE CAN BE FORMED BY ALKALI DEVELOPMENT WITH HIGH RESOLUTION KABUSHIKI KAISHA TOSHIBA (JP) 2001-10-16 US disclosed
EP-1081150-A1 4-Oxatricyclo(4.3.1.1-3,8)undecan-5-one derivatives and process for producing the same Daicel Chemical Industries, Ltd. (JP) 2001-03-07 EP disclosed
EP-0497972-B1 CHEMILUMINESCENT 3-(SUBSTITUTED ADAMANT-2'-YLIDENE) 1,2-DIOXETANES TROPIX INC (US) 1998-12-23 EP disclosed
US-5831102-A HEAT RESISTANCE; STABILITY TROPIX, INC. (US) 1998-11-03 US disclosed
US-5543295-A ENZYMATICALLY CLEAVABLE; ANALYZING TROPIX, INC. (US) 1996-08-06 US disclosed
US-5330900-A Chemiluminescent 3-(substituted adamant-2'-ylidene) 1,2-dioxetanes TROPIX, INC. (US) 1994-07-19 US disclosed
US-5326882-A High speed bioassay TROPIX, INC. (US) 1994-07-05 US disclosed
EP-0497972-A1 CHEMILUMINESCENT 3-(SUBSTITUTED ADAMANT-2'-YLIDENE) 1,2-DIOXETANES TROPIX, INC. (US) 1992-08-12 EP disclosed
US-5112960-A Enzyme cleavable 1,2-dioxetane compound APPLIED BIOSYSTEMS, LLC 1992-05-12 US disclosed
WO-1992004341-A1 CHEMILUMINESCENT 3-(SUBSTITUTED ADAMANT-2'-YLIDENE) 1,2-DIOXETANES TROPIX, INC. (US) 1992-03-19 WO disclosed