SCHEMBL545517

SCHEMBL545517

O=C(O)CN(CCN(CC(=O)O)Cc1cc(Cl)ccc1O)Cc1cc(Cl)ccc1O

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALOX15 P16050 4/20 0.50
HIF1A Q16665 3/20 0.50
MEN1 O00255 3/20 0.50
HPGD P15428 3/20 0.50
KMT2A Q03164 3/20 0.50
LMNA P02545 3/20 0.50
MAPT P10636 3/20 0.50
CYP3A4 P08684 2/20 0.50
BLM P54132 2/20 0.50
USP2 O75604 2/20 0.50
HTT P42858 2/20 0.50
SMN1; SMN2 Q16637 2/20 0.50
SLC22A1 O15245 1/20 0.50
HSP90AA1 P07900 1/20 0.50
HSPD1 P10809 1/20 0.50
HSPA5 P11021 1/20 0.50
IDO1 P14902 1/20 0.50
ALOX12 P18054 1/20 0.50
CASP1 P29466 1/20 0.50
HSPE1 P61604 1/20 0.50

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13074723 0.83 EGFR (0.46) ALOX15HIF1AMEN1HPGDKMT2A
SCHEMBL935118 0.81 POLB (0.49) ALOX15HPGDLMNAMAPTBLM
SCHEMBL545256 0.81 HTT (0.48) ALOX15MEN1HPGDKMT2ALMNA
SCHEMBL10883741 0.79 GAA (0.54) HIF1AMEN1HPGDKMT2ALMNA
Hydrochloric Acid SCHEMBL934885 0.79 HTT (0.47) ALOX15MEN1HPGDKMT2ALMNA
SCHEMBL23629772 0.79 HTT (0.47) ALOX15MEN1HPGDKMT2ALMNA
SCHEMBL935095 0.79 HTT (0.47) ALOX15MEN1HPGDKMT2ALMNA
SCHEMBL935494 0.79 POLB (0.48) ALOX15HPGDLMNAMAPTBLM
SCHEMBL935126 0.79 HTT (0.47) ALOX15MEN1HPGDKMT2ALMNA
Hydrochloric Acid SCHEMBL2794700 0.78 HTT (0.46) ALOX15MEN1HPGDKMT2ALMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 23 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0858102-B1 Surface treatment composition and method for treating surface of substrate by using the same MITSUBISHI CHEM CORP (JP) 2007-07-25 EP claimed
EP-1715510-B2 SUBSTRATE CLEANING LIQUID FOR SEMICONDUCTOR DEVICE AND CLEANING METHOD MITSUBISHI CHEM CORP (JP) 2016-02-24 EP disclosed
US-8110534-B2 Cleaning solution for substrate for semiconductor device and process for producing substrate for semiconductor device MITSUBISHI CHEMICAL CORPORATION (JP) 2012-02-07 US disclosed
EP-1715510-B1 SUBSTRATE CLEANING LIQUID FOR SEMICONDUCTOR DEVICE AND CLEANING METHOD MITSUBISHI CHEM CORP (JP) 2011-04-13 EP disclosed
US-20100167972-A1 CLEANING SOLUTION FOR SUBSTRATE FOR SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCING SUBSTRATE FOR SEMICONDUCTOR DEVICE MITSUBISHI CHEMICAL CORPORATION (JP) 2010-07-01 US disclosed
EP-1342777-B9 Substrate cleaning liquid media and cleaning method MITSUBISHI CHEM CORP (JP) 2010-02-17 EP disclosed
US-7621281-B2 Cleaning solution for cleaning substrate for semiconductor devices and cleaning method using the same MITSUBISHI CHEMICAL CORPORATION (JP) 2009-11-24 US disclosed
EP-1342777-B1 Substrate cleaning liquid media and cleaning method MITSUBISHI CHEM CORP (JP) 2009-08-19 EP disclosed
US-20080011321-A1 Cleaning solution for cleaning substrate for semiconductor devices and cleaning method using the same MITSUBISHI CHEMICAL CORPORATION (JP) 2008-01-17 US disclosed
EP-0858102-B1 Surface treatment composition and method for treating surface of substrate by using the same MITSUBISHI CHEM CORP (JP) 2007-07-25 EP disclosed
EP-1715510-A1 SUBSTRATE CLEANING LIQUID FOR SEMICONDUCTOR DEVICE AND CLEANING METHOD Mitsubishi Chemical Corporation (JP) 2006-10-25 EP disclosed
US-6896744-B2 Method for cleaning a surface of a substrate MITSUBISHI CHEMICAL CORPORATION (JP) 2005-05-24 US disclosed
US-20050020463-A1 Cleaning solution for cleaning substrate for semiconductor devices and cleaning method using the same MITSUBISHI CHEMICAL CORPORATION (JP) 2005-01-27 US disclosed
US-20040099290-A1 Method for cleaning a surface of a substrate MITSUBISHI CHEMICAL CORPORATION (JP) 2004-05-27 US disclosed
EP-1389496-A1 METHOD FOR CLEANING SURFACE OF SUBSTRATE MITSUBISHI CHEMICAL CORPORATION (JP) 2004-02-18 EP disclosed
EP-1342777-A1 Substrate cleaning liquid media and cleaning method MITSUBISHI CHEMICAL CORPORATION (JP) 2003-09-10 EP disclosed
US-20030144163-A1 Substrate surface cleaning liquid mediums and cleaning method MITSUBISHI CHEMICAL CORPORATION (JP) 2003-07-31 US disclosed
US-6228179-B1 CONTACTING A SEMI-CONDUCTOR SUBSTRATE WITH A SURFACE TREATMENT COMPOSITION CONTAINING A COMPLEXING AGENT AS A METAL DEPOSITION PREVENTIVE IN A LIQUID MEDIUM, IN WHICH THE COMPLEXING AGENT IS AN ETHYLENEDIAMINEPHENOL DERIVATIVE MITSUBISHI CHEMICAL CORPORATION (JP) 2001-05-08 US disclosed
US-6143706-A FOR CLEANING SUBSTRATES SUCH AS SEMICONDUCTORS; PREVENTS SUBSTRATE SURFACE FROM BEING CONTAMINATED WITH METAL IMPURITIES FROM THE SURFACE TREATMENT COMPOSITION AND STABLY PROVIDES CLEAN SUBSTRATE SURFACE MITSUBISHI CHEMICAL CORPORATION (JP) 2000-11-07 US disclosed
EP-0858102-A2 Surface treatment composition and method for treating surface of substrate by using the same MITSUBISHI CHEMICAL CORPORATION (JP) 1998-08-12 EP disclosed