SCHEMBL5588475

SCHEMBL5588475

CN1C(C)(C)CC(C=CCC(=O)O)CC1(C)C

nearest known ligand 0.38

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.38
CYP2D6 P10635 1/20 0.38
ALOX15 P16050 1/20 0.38
TSHR P16473 1/20 0.33
NFKB1 P19838 1/20 0.33
CYP2C19 P33261 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Bicarbonate SCHEMBL28854272 0.78 TSHR (0.35) TSHRNFKB1CYP2C19
SCHEMBL3640852 0.78 TSHR (0.35) TSHRNFKB1CYP2C19
SCHEMBL10987735 0.74
SCHEMBL6685009 0.72
SCHEMBL9065657 0.72
SCHEMBL10891519 0.72
SCHEMBL27612828 0.71 TSHR (0.33) TSHRNFKB1CYP2C19
Sebacic Acid SCHEMBL8181504 0.71 TSHR (0.39) ALDH1A1ALOX15TSHRNFKB1CYP2C19
SCHEMBL11586258 0.69 CYP2C19 (0.37) ALDH1A1CYP2D6TSHRNFKB1CYP2C19
SCHEMBL14463136 0.69 ITGB3 (0.35) ALDH1A1CYP2D6TSHRNFKB1CYP2C19

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 73 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4386037-A1 SILPHENYLENE-SKELETON-CONTAINING POLYMER, PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMATION METHOD, AND METHOD FOR MANUFACTURING OPTICAL SEMICONDUCTOR DEVICE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-19 EP disclosed
US-20240184206-A1 LAMINATE, METHOD FOR MANUFACTURING LAMINATE, AND METHOD FOR PATTERNING SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-06 US disclosed
EP-4365679-A1 LAYERED BODY, METHOD FOR MANUFACTURING LAYERED BODY, AND METHOD FOR FORMING PATTERN SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-08 EP disclosed
EP-3656803-B1 POLYSILOXANE SKELETON POLYMER, PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING PROCESS, AND FABRICATION OF OPTO-SEMICONDUCTOR DEVICE SHINETSU CHEMICAL CO (JP) 2024-04-10 EP disclosed
EP-3070137-B1 SILICONE ADHESIVE COMPOSITION AND SOLID-STATE IMAGING DEVICE SHINETSU CHEMICAL CO (JP) 2023-12-27 EP disclosed
EP-3597704-B1 PHOTOSENSITIVE RESIN COMPOSITION AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2023-10-25 EP disclosed
US-11693317-B2 Photosensitive resin composition, pattern forming process, and fabrication of opto-semiconductor device SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-07-04 US disclosed
EP-3572879-B1 PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING PROCESS, AND FABRICATION OF OPTO-SEMICONDUCTOR DEVICE SHINETSU CHEMICAL CO (JP) 2023-04-19 EP disclosed
EP-3505551-B1 PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING PROCESS, AND FABRICATION OF OPTO-SEMICONDUCTOR DEVICE SHINETSU CHEMICAL CO (JP) 2023-02-08 EP disclosed
US-20230030194-A1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE RESIN FILM, PHOTOSENSITIVE DRY FILM, PATTERNING PROCESS, AND LIGHT EMITTING DEVICE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-02-02 US disclosed
CN-105722939-A Silicone adhesive composition and solid-state imaging device 信越化学工业株式会社 2016-06-29 CN disclosed
US-9263333-B2 Wafer processing laminate, wafer processing member, temporary adhering material for processing wafer, and manufacturing method of thin wafer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-02-16 US disclosed
US-20140154868-A1 WAFER PROCESSING LAMINATE, WAFER PROCESSING MEMBER, TEMPORARY ADHERING MATERIAL FOR PROCESSING WAFER, AND MANUFACTURING METHOD OF THIN WAFER SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-06-05 US disclosed
EP-2738797-A2 Wafer processing laminate, wafer processing member, temporary adhering material for processing wafer, and manufacturing method of thin wafer Shin-Etsu Chemical Co., Ltd. (JP) 2014-06-04 EP disclosed
US-8735264-B2 Temporary adhesive composition and method for manufacturing thin wafer using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-05-27 US disclosed
US-20130089967-A1 TEMPORARY ADHESIVE COMPOSITION AND METHOD FOR MANUFACTURING THIN WAFER USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-11 US disclosed
EP-2578656-A1 Temporary adhesive composition and method for manufacturing thin wafer using the same Shin-Etsu Chemical Co., Ltd. (JP) 2013-04-10 EP disclosed
US-20070166591-A1 POLYMER ELECTROLYTE COMPOSITION AND APPLICATION THEREOF SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-07-19 US disclosed
US-6632541-B2 Weather resistance, and recycling properties SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-10-14 US disclosed
US-20020072561-A1 OLEFIN-BASED COPOLYMER COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2002-06-13 US disclosed