SCHEMBL5889586

SCHEMBL5889586

SCC(S)CSCC1CS1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21409498 0.83
SCHEMBL332941 0.79
SCHEMBL16950094 0.77 LMNA (0.32)
SCHEMBL4646488 0.74
SCHEMBL14093974 0.74
SCHEMBL1025322 0.74
SCHEMBL21791160 0.74 LMNA (0.30)
SCHEMBL172244 0.72
SCHEMBL15360430 0.72 NR1I2 (0.42)
SCHEMBL331076 0.72 NR1I2 (0.42)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2020040486-A1 STABILIZER FOR EPISULFIDE-BASED OPTICAL MATERIAL HAVING HIGH REFRACTIVE INDEX, COMPOSITION FOR OPTICAL MATERIAL USING SAME, AND METHOD FOR PRODUCING OPTICAL MATERIAL 주식회사 케이오씨솔루션 2020-02-27 WO disclosed
WO-2020040486-A1 STABILIZER FOR EPISULFIDE-BASED OPTICAL MATERIAL HAVING HIGH REFRACTIVE INDEX, COMPOSITION FOR OPTICAL MATERIAL USING SAME, AND METHOD FOR PRODUCING OPTICAL MATERIAL 주식회사 케이오씨솔루션 2020-02-27 WO disclosed
US-7026372-B2 Enic compounds, sulfur-containing polyenic compound, sulfur-containing polythiol compound, high refractive index photocurable composition and cured product thereof MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2006-04-11 US disclosed
US-20050154073-A1 Enic compounds, sulfur-containing polyenic compound, sulfur-containing polythiol compound, high refractive index photocurable composition and cured product thereof ISHII KENJI (JP) 2005-07-14 US disclosed
US-6872333-B2 Enic compounds, sulfur-containing polyenic compound, sulfur-containing polythiol compound, high refractive index photocurable composition and cured product thereof MITSUBISHI GAS CHEMICAL COMPANY, LTD. (JP) 2005-03-29 US disclosed
US-20030195270-A1 Enic compounds, sulfur-containing polyenic compound, sulfur-containing polythiol compound, high refractive index photocurable composition and cured product thereof ISHII KENJI (JP) 2003-10-16 US disclosed