SCHEMBL59480

SCHEMBL59480

CCCCCCCCCCCCS(=O)(=O)ON1C(=O)c2ccc3ccccc3c2C1=O

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MAPT P10636 4/20 0.39
ALDH1A1 P00352 3/20 0.39
MEN1 O00255 2/20 0.39
KMT2A Q03164 2/20 0.39
RAB9A P51151 1/20 0.39
SMN1; SMN2 Q16637 1/20 0.39
TDP1 Q9NUW8 2/20 0.37
DNMT1 P26358 1/20 0.37
KDM4E B2RXH2 2/20 0.36
VDR P11473 2/20 0.36
F2 P00734 1/20 0.36
GAA P10253 1/20 0.36
L3MBTL1 Q9Y468 1/20 0.36
SLC2A1 P11166 1/20 0.35
CES1 P23141 2/20 0.34
CDC25A P30304 1/20 0.34
FAAH O00519 2/20 0.34
HPGD P15428 1/20 0.34
HTT P42858 1/20 0.34
MGLL Q99685 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5707415 1.00 MAPT (0.39) MAPTALDH1A1MEN1KMT2ARAB9A
SCHEMBL11039442 0.95 ALDH1A1 (0.40) MAPTALDH1A1MEN1KMT2ARAB9A
SCHEMBL11029444 0.82 KDM4E (0.50) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL2901056 0.82 KDM4E (0.50) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL11025672 0.82 KDM4E (0.50) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL11199907 0.81 KDM4E (0.51) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL5707416 0.79 TDP1 (0.60) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL11040638 0.79 TDP1 (0.60) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL28404191 0.79 TDP1 (0.60) MAPTALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL28418011 0.79 TDP1 (0.60) MAPTALDH1A1MEN1KMT2ASMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 135 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9235119-B2 Exposure photolithography methods GLOBALFOUNDRIES INC. (KY) 2016-01-12 US claimed
US-20140349237-A1 EXPOSURE PHOTOLITHOGRAPHY METHODS GLOBALFOUNDRIES U.S. INC. 2014-11-27 US claimed
US-8846296-B2 Photoresist compositions INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2014-09-30 US claimed
US-8759415-B2 Aromatic vinyl ether based reverse-tone step and flash imprint lithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2014-06-24 US claimed
US-8568960-B2 Multiple exposure photolithography methods INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-29 US claimed
US-20120291668-A1 AROMATIC VINYL ETHER BASED REVERSE-TONE STEP AND FLASH IMPRINT LITHOGRAPHY INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-11-22 US claimed
US-8262961-B2 Aromatic vinyl ether based reverse-tone step and flash imprint lithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-09-11 US claimed
US-8128832-B2 Processes and materials for step and flash imprint lithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-03-06 US claimed
US-20080174051-A1 AROMATIC VINYL ETHER BASED REVERSE-TONE STEP AND FLASH IMPRINT LITHOGRAPHY GLOBALFOUNDRIES INC. (KY) 2008-07-24 US claimed
US-20080169268-A1 PROCESSES AND MATERIALS FOR STEP AND FLASH IMPRINT LITHOGRAPHY GLOBALFOUNDRIES INC. (KY) 2008-07-17 US claimed
EP-1938149-A2 LOW ACTIVATION ENERGY DISSOLUTION MODIFICATION AGENTS FOR PHOTORESIST APPLICATIONS International Business Machines Corporation (US) 2008-07-02 EP claimed
US-7358029-B2 Polymer, a photoacid generator and a dissolution modification agent; patterning; image resolution INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-04-15 US claimed
US-20070298176-A1 AROMATIC VINYL ETHER BASED REVERSE-TONE STEP AND FLASH IMPRINT LITHOGRAPHY GLOBALFOUNDRIES INC. (KY) 2007-12-27 US claimed
US-20070231734-A1 Polymer, a photoacid generator and a dissolution modification agent; patterning; image resolution GLOBALFOUNDRIES U.S. INC. 2007-10-04 US claimed
WO-2007039346-A2 LOW ACTIVATION ENERGY DISSOLUTION MODIFICATION AGENTS FOR PHOTORESIST APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2007-04-12 WO claimed
US-20070051697-A1 Processes and materials for step and flash imprint lithography GLOBALFOUNDRIES INC. (KY) 2007-03-08 US claimed
US-20230350302-A1 POLYMER CROSSLINK DE-CROSSLINK PROCESSES FOR RESIST PATTERNING TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2023-11-02 US disclosed
US-11667786-B2 Encapsulating or filling composition for electronic devices and electronic apparatus SAMSUNG DISPLAY CO., LTD. (KR) 2023-06-06 US disclosed
EP-0058638-B1 CURABLE COMPOSITIONS CONTAINING AN ACID-CURABLE RESIN, AND PROCESS FOR CURING THEM CIBA-GEIGY AG (CH) 1985-08-28 EP disclosed
EP-0058638-A2 Curable compositions containing an acid-curable resin, and process for curing them CIBA-GEIGY AG (CH) 1982-08-25 EP disclosed