SCHEMBL635332

SCHEMBL635332

CN(C)C(=O)C(C)(C)O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Dimethyl Sulfoxide SCHEMBL1946114 0.87 ALDH1A1 (0.35)
SCHEMBL1106444 0.79
SCHEMBL16944043 0.76 ALDH1A1 (0.39)
SCHEMBL4071999 0.73
SCHEMBL9893964 0.71 ALDH1A1 (0.36)
SCHEMBL2745822 0.71
SCHEMBL1048076 0.71
SCHEMBL10903390 0.71
SCHEMBL13072431 0.71
SCHEMBL7438406 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 84 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2930565-B1 STRIPPING SOLUTION FOR PHOTOLITHOGRAPHY AND PATTERN FORMING PROCESS TOKYO OHKA KOGYO CO LTD (JP) 2016-11-30 EP claimed
EP-2930565-A1 STRIPPING SOLUTION FOR PHOTOLITHOGRAPHY AND PATTERN FORMING PROCESS TOKYO OHKA KOGYO CO., LTD. (JP) 2015-10-14 EP claimed
US-8455419-B2 Photoresist stripping agent composition MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2013-06-04 US claimed
US-20120149622-A1 PHOTORESIST STRIPPING AGENT COMPOSITION MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2012-06-14 US claimed
US-7317026-B2 Sleep disorders; side effect reduction ; antihistamine antagonist HYPNION, INC. (US) 2008-01-08 US claimed
US-20040142972-A1 CNS target modulators HYPNION, INC. 2004-07-22 US claimed
US-11965111-B2 Surface treatment agent and surface treatment method TOKYO OHKA KOGYO CO., LTD. (JP) 2024-04-23 US disclosed
US-20230359123-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-11-09 US disclosed
US-20230359123-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-11-09 US disclosed
US-11798810-B2 Resist underlayer film-forming composition containing amide solvent NISSAN CHEMICAL CORPORATION (JP) 2023-10-24 US disclosed
US-11798810-B2 Resist underlayer film-forming composition containing amide solvent NISSAN CHEMICAL CORPORATION (JP) 2023-10-24 US disclosed
US-20230314955-A1 PHOTORESIST STRIPPER AND METHOD OF TREATING SUBSTRATE USING SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2023-10-05 US disclosed
US-20230259031-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-08-17 US disclosed
US-4749245-A SUBSTRATE POLYMER AND TWO LAYERS OF HIGH MOLECULAR WEIGHT POLYMERS OF DIFFERENT SOLUBILITY AND REFRACTIVE INDEX KURARAY CO., LTD. (JP) 1988-06-07 US disclosed
EP-0194639-A2 Thin film waveguide path and manufacturing method therefor Kuraray Co., Ltd. (JP) 1986-09-17 EP disclosed
EP-0104483-A2 Sulfamoyl benzophenon derivatives, process for their preparation, their use, and pharmaceutical compositions based on these compounds HOECHST AKTIENGESELLSCHAFT (DE) 1984-04-04 EP disclosed
US-4324721-A 1-(4-Alkylaminonaphthylazo)-4-nitrobenzene disperse dyes E. I. DU PONT DE NEMOURS AND COMPANY (US) 1982-04-13 US disclosed
US-4070189-A CATIONIC POLYBENZYLVINYL AMMONIUM OR PHOSPHONIUM SALT EASTMAN KODAK COMPANY (US) 1978-01-24 US disclosed
US-4054560-A 1-(4-Acyloxyalkylaminonaphthylazo)-4-nitrobenzene disperse dyes E. I. DU PONT DE NEMOURS AND COMPANY (US) 1977-10-18 US disclosed
US-3970617-A POLYESTER E. I. DU PONT DE NEMOURS AND COMPANY (US) 1976-07-20 US disclosed