SCHEMBL6555571

SCHEMBL6555571

CC1(O)COC(=O)C1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL22905077 0.76
SCHEMBL880 0.76
SCHEMBL1331223 0.76
SCHEMBL879 0.76
SCHEMBL12689738 0.76
Water SCHEMBL23042869 0.75 LMNA (0.96)
Water SCHEMBL23042868 0.75 LMNA (0.96)
SCHEMBL7073445 0.74
SCHEMBL11407604 0.74 LMNA (0.54)
SCHEMBL45972 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 140 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1052258-B1 PROCESS FOR PRODUCING BETA-HYDROXY-GAMMA-BUTYROLACTONE DERIVATIVES AND BETA-(METH)ACRYLOYLOXY-GAMMA-BUTYROLACTONE DERIVATIVES MITSUBISHI RAYON CO (JP) 2004-03-03 EP claimed
US-6313321-B1 Process for preparing β-hydroxy-γ-butyrolactones and β-(meth)acryloyloxy-γ-butrolactones MITSUBISHI RAYON CO., LTD. (JP) 2001-11-06 US claimed
JP-10212283-A None JP disclosed
US-11874601-B2 Resist composition, method of forming resist pattern, compound, and acid diffusion-controlling agent TOKYO OHKA KOGYO CO., LTD. (JP) 2024-01-16 US disclosed
US-11835857-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-12-05 US disclosed
US-11835857-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-12-05 US disclosed
US-11829068-B2 Resist composition, method of forming resist pattern, compound, and resin TOKYO OHKA KOGYO CO., LTD. (JP) 2023-11-28 US disclosed
US-11822240-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-11-21 US disclosed
US-11780946-B2 Alternating copolymer, method of producing alternating copolymer, method of producing polymeric compound, and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-10-10 US disclosed
US-11754922-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-11754922-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-20130260314-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2013-10-03 US disclosed
EP-2296040-A1 Positive photosensitive composition Fujifilm Corporation (JP) 2011-03-16 EP disclosed
EP-1052258-B1 PROCESS FOR PRODUCING BETA-HYDROXY-GAMMA-BUTYROLACTONE DERIVATIVES AND BETA-(METH)ACRYLOYLOXY-GAMMA-BUTYROLACTONE DERIVATIVES MITSUBISHI RAYON CO (JP) 2004-03-03 EP disclosed
US-6313321-B1 Process for preparing β-hydroxy-γ-butyrolactones and β-(meth)acryloyloxy-γ-butrolactones MITSUBISHI RAYON CO., LTD. (JP) 2001-11-06 US disclosed
US-6313321-B1 Process for preparing β-hydroxy-γ-butyrolactones and β-(meth)acryloyloxy-γ-butrolactones MITSUBISHI RAYON CO., LTD. (JP) 2001-11-06 US disclosed
EP-1052258-A1 PROCESS FOR PRODUCING BETA-HYDROXY-GAMMA-BUTYROLACTONE DERIVATIVES AND BETA-(METH)ACRYLOYLOXY-GAMMA-BUTYROLACTONE DERIVATIVES Mitsubishi Rayon Co., Ltd. (JP) 2000-11-15 EP disclosed
CN-1043529-C Carbonylation of epoxides SHELL INT RESEARCH (NL) 1999-06-02 CN disclosed
JP-H10212283-A PRODUCTION OF BETA-HYDROXY-GAMMA-BUTYROLACTONES AND BETA-(METH)ACRYOYLOXY-GAMMA-BUTYROLACTONES MITSUBISHI RAYON CO LTD 1998-08-11 JP disclosed
CN-1082540-A The carbonylation of epoxy compounds SHELL INT RESEARCH (NL) 1994-02-23 CN disclosed