SCHEMBL676288

SCHEMBL676288

C[CH]c1ccccc1/C=C/CCCCC

nearest known ligand 0.46

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
CYSLTR2 Q9NS75 2/20 0.46
CYSLTR1 Q9Y271 2/20 0.46
PDE5A O76074 1/20 0.40
SOAT2 O75908 1/20 0.39
SOAT1 P35610 1/20 0.39
EPHX2 P34913 4/20 0.37
FAAH O00519 4/20 0.37
TLR8 Q9NR97 1/20 0.36
TRPV1 Q8NER1 2/20 0.36
CNR1 P21554 1/20 0.35
CNR2 P34972 1/20 0.35
TNNC1 P63316 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6046925 0.92 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL10482226 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL9857641 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL8966064 0.82 CYSLTR2 (0.47) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL9857570 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL489152 0.82 CYSLTR2 (0.47) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL9857635 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL8500639 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL8500643 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1
SCHEMBL3525106 0.82 CYSLTR2 (0.50) CYSLTR2CYSLTR1PDE5ASOAT2SOAT1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 20 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
EP-1367439-B1 Radiation-sensitive composition FUJIFILM CORP (JP) 2012-08-01 EP disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
EP-2399168-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM Corporation (JP) 2011-12-28 EP disclosed
WO-2010150917-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2010-12-29 WO disclosed
EP-1465010-B1 Positive resist composition FUJIFILM CORP (JP) 2009-10-21 EP disclosed
US-7250246-B2 Positive resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2007-07-31 US disclosed
US-7232640-B1 Positive resist composition FUJIFILM CORPORATION (JP) 2007-06-19 US disclosed
US-20070128547-A1 POSITIVE RESIST COMPOSITION FUJI PHOTO FILM CO., LTD. 2007-06-07 US disclosed
US-7179579-B2 Radiation-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-20050164123-A1 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. 2005-07-28 US disclosed
EP-1557720-A1 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-07-27 EP disclosed
EP-1465010-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2004-10-06 EP disclosed
US-6743565-B2 POLYSTYRENE OXY DERIVATIVES THAT DECOMPOSE UNDER AN ACID TO INCREASE THE SOLUBILITY IN AN ALKALI DEVELOPER AND AN ACID GENERATOR FUJI PHOTO FILM CO., LTD. (JP) 2004-06-01 US disclosed
US-20040033437-A1 Radiation-sensitive composition FUJI PHOTO FILM CO., LTD. 2004-02-19 US disclosed
US-6692883-B2 GENERATING ACID; ADJUSTMENT SOLUBILITY IN ALKLAINE DEVELOPER FUJI PHOTO FILM CO., LTD. (JP) 2004-02-17 US disclosed
EP-1367439-A1 Radiation-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2003-12-03 EP disclosed
US-6630280-B1 Resin and compound that generates an arylsulfonic acid when exposed to actinic radiation; sensitivity; resolution; smoothness FUJI PHOTO FILM CO., LTD. (JP) 2003-10-07 US disclosed
US-20030108811-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2003-06-12 US disclosed
US-20020012866-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2002-01-31 US disclosed