SCHEMBL707919

SCHEMBL707919

CCC[SiH](CCC)CCCC[SiH](CCC)CCC

nearest known ligand 0.33

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
TSHR P16473 3/20 0.33
LMNA P02545 3/20 0.33
ALDH1A1 P00352 2/20 0.33
SMN1; SMN2 Q16637 1/20 0.32
THRB P10828 1/20 0.31
HSD17B10 Q99714 1/20 0.30
MEN1 O00255 1/20 0.30
KMT2A Q03164 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27801423 0.93 TSHR (0.44) TSHRLMNAALDH1A1SMN1; SMN2THRB
SCHEMBL708607 0.92 TSHR (0.33) TSHRLMNAALDH1A1SMN1; SMN2THRB
SCHEMBL15533414 0.89 TSHR (0.40) TSHRLMNAALDH1A1SMN1; SMN2THRB
SCHEMBL10415307 0.89 TSHR (0.40) TSHRLMNAALDH1A1SMN1; SMN2THRB
SCHEMBL20576383 0.89 TSHR (0.40) TSHRLMNAALDH1A1SMN1; SMN2THRB
SCHEMBL126009 0.88 LMNA (0.31) TSHRLMNA
SCHEMBL416766 0.85 TSHR (0.50) TSHRLMNAALDH1A1SMN1; SMN2THRB
SCHEMBL706848 0.85 TSHR (0.43) TSHRLMNAALDH1A1SMN1; SMN2THRB
Hydrochloric Acid SCHEMBL3749298 0.84
SCHEMBL28759835 0.84

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124239-B2 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2012-02-28 US disclosed
US-20100155121-A1 SILICA FILM FORMING MATERIAL, SILICA FILM AND METHOD OF MANUFACTURING THE SAME, MULTILAYER WIRING STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME FUJITSU LIMITED (JP) 2010-06-24 US disclosed
US-7659357-B2 Precursor organosilicon polymer of 1,2-Bis(dimethylethoxysilyl)ethane, 1,4-bis(dimethylethoxysilyl)benzene, tetraethoxysilane, methyltriethoxysilane, phenyltriethoxysilane; dielectric (DE) films having etching/chemical/moisture resistance; adhesion; low DE constant; minimal wiring delay; high speed FUJITSU LIMITED (JP) 2010-02-09 US disclosed
US-20070026689-A1 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2007-02-01 US disclosed