SCHEMBL73175

SCHEMBL73175

CCC(CC)(CC)OC=O

nearest known ligand 0.45

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
TDP1 Q9NUW8 2/20 0.45
ALDH1A1 P00352 1/20 0.32
MAPK1 P28482 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Ammonia Solution, Strong SCHEMBL10910450 0.97 TDP1 (0.43) TDP1ALDH1A1MAPK1
SCHEMBL4670005 0.84 TDP1 (0.38) TDP1
SCHEMBL4669979 0.84 TDP1 (0.38) TDP1
SCHEMBL13143754 0.82 TDP1 (0.36) TDP1
SCHEMBL28285690 0.78 FDPS (0.38) TDP1
SCHEMBL4671841 0.77 TDP1 (0.41) TDP1ALDH1A1
SCHEMBL28088 0.73
SCHEMBL271288 0.73
SCHEMBL25775904 0.71 TDP1 (0.42) TDP1
SCHEMBL28712355 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 821 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6730451-B2 FLUOROACRYLATE POLYMERS; TRANSPARENCY; PREVENTING NEGATIVE WORKING; LOW ABSORPTION OF FLUORINE EXCIMER LASER LIGHT; HIGH TRANSMITTANCE TO VACUUM ULTRAVIOLET RADITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-05-04 US claimed
US-6623909-B2 Polysiloxane SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-09-23 US claimed
US-6596463-B2 Photosensitivity, resolution, chemical resistance SHIN-ETSU CHEMICAL, CO., LTD. (JP) 2003-07-22 US claimed
US-6461790-B1 NOVEL POLYMER HAVING HIGH TRANSMITTANCE TO VACUUM ULTRAVIOLET RADIATION OF UP TO 300 NANOMETERS; RESIST MATERIALS HAVE SUFFICIENT TRANSPARENCY IN REGION OF EXCIMER LASER AND SATISFY RESOLUTION AND SENSITIVITY REQUIREMENTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-10-08 US claimed
US-6461789-B1 NOVEL POLYMER HAVING HIGH TRANSMITTANCE TO VACUUM ULTRAVIOLET RADIATION OF UP TO 300 NANOMETERS; RESIST MATERIALS HAVE SUFFICIENT TRANSPARENCY IN REGION OF EXCIMER LASERS, AND SATISFY RESOLUTION AND SENSITIVITY REQUIREMENTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-10-08 US claimed
US-6436606-B1 POLYMERS AND PHOTORESISTS COATING SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-08-20 US claimed
US-5811475-A REACTING A CARBON WITH A POLYMER HAVING A REACTIVE GROUP AND A HYDROLYZABLE TERT-ALKYL ACRYLIC ESTER; PRINTING INKS; DIELECTRICS; HIGH ELECTRICAL RESISTANCE NIPPON OIL CO., LTD. (JP) 1998-09-22 US claimed
US-20240241442-A1 Positive Resist Material And Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-07-18 US disclosed
US-20240210830-A1 RESIST COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-27 US disclosed
US-12013639-B2 Positive resist material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-18 US disclosed
US-20240184200-A1 AMINE COMPOUND, CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-06 US disclosed
US-20240168379-A1 Positive Resist Material And Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-23 US disclosed
US-20240168378-A1 Positive Resist Material And Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-23 US disclosed
EP-1053985-A1 Resist compositions and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2000-11-22 EP disclosed
US-6147249-A ESTER COMPOUND CAPABLE OF FORMING ACID-DECOMPOSABLE POLYMER WHICH CAN BE BLENDED AS BASE RESIN TO FORMULATE RESIST COMPOSITION HAVING HIGHER SENSITIVITY, RESOLUTION AND ETCHING RESISTANCE THAN CONVENTIONAL RESIST COMPOSITIONS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-11-14 US disclosed
EP-1031879-A1 Novel ester compounds, polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-08-30 EP disclosed
EP-1004568-A2 Novel ester compounds, polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-05-31 EP disclosed
US-5821277-A Thermosetting and procuring compositions for color filters and method for making the same NIPPON OIL CO., LTD. (JP) 1998-10-13 US disclosed
US-5811475-A REACTING A CARBON WITH A POLYMER HAVING A REACTIVE GROUP AND A HYDROLYZABLE TERT-ALKYL ACRYLIC ESTER; PRINTING INKS; DIELECTRICS; HIGH ELECTRICAL RESISTANCE NIPPON OIL CO., LTD. (JP) 1998-09-22 US disclosed
EP-0753548-A2 Method for producing carbonaceous material NIPPON OIL COMPANY, LIMITED (JP) 1997-01-15 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20240168378-A1 Positive Resist Material And Patterning Process HNRNPU, DSTN, NSUN2 TDP1 3966/4885ALDH1A1 3565/4885MAPK1 1931/4885
US-20240184200-A1 AMINE COMPOUND, CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS ADAR, HNRNPU, POLQ TDP1 1586/4885ALDH1A1 4624/4885MAPK1 2736/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.