SCHEMBL7538702

SCHEMBL7538702

C=Cc1cccc(OC(C)(C)OC(C)=O)c1

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PTGS2 P35354 2/20 0.39
TP53 P04637 1/20 0.39
TDP1 Q9NUW8 1/20 0.39
CYP3A4 P08684 2/20 0.38
FBP1 P09467 1/20 0.38
ACHE P22303 1/20 0.37
MAPT P10636 3/20 0.37
CYP2D6 P10635 1/20 0.37
CYP2C9 P11712 1/20 0.37
CYP2C19 P33261 1/20 0.37
LMNA P02545 1/20 0.35
ALDH1A1 P00352 4/20 0.35
SMN1; SMN2 Q16637 2/20 0.35
KDM4E B2RXH2 1/20 0.35
MEN1 O00255 3/20 0.34
KMT2A Q03164 3/20 0.34
ALOX5 P09917 2/20 0.34
FOS P01100 1/20 0.34
JUN P05412 1/20 0.34
BCHE P06276 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7076942 0.81 HIF1A (0.37) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL1358728 0.80 TP53 (0.44) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL1359683 0.78 TP53 (0.43) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL411374 0.78 CYP3A4 (0.58) TP53TDP1CYP3A4ACHEMAPT
SCHEMBL30988604 0.77 TP53 (0.48) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL408218 0.77 TP53 (0.48) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL3708355 0.76 TP53 (0.47) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL1359805 0.76 TP53 (0.41) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL1359770 0.76 TP53 (0.41) TP53TDP1CYP3A4FBP1MAPT
SCHEMBL1360569 0.76 TP53 (0.41) PTGS2TP53TDP1CYP3A4FBP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20020015906-A1 Polymer for photoresist, method of production thereof and photoresist composition containing polymer SAMSUNG ELECTRONICS CO., LTD. (KR) 2002-02-07 US disclosed
EP-0704762-B1 Resist material and pattern formation WAKO PURE CHEM IND LTD (JP) 1999-12-15 EP disclosed
US-5558971-A HYDROXYSTYRENE POLYMER DERIVATIVES, PHOTOACID GENERATOR WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1996-09-24 US disclosed
US-5558976-A HYDROXYSTYRENE POLYMER DERIVATIVES, PHOTOACID GENERATOR, PHOTORESISTS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1996-09-24 US disclosed
EP-0704762-A1 Resist material and pattern formation WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1996-04-03 EP disclosed