SCHEMBL786258

SCHEMBL786258

CCC(C)C(=O)OC1CCCCC1

nearest known ligand 0.50

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
EPHX1 P07099 3/20 0.50
CYP19A1 P11511 1/20 0.47
NAAA Q02083 2/20 0.46
HTT P42858 1/20 0.41
L3MBTL1 Q9Y468 2/20 0.41
EPHX2 P34913 2/20 0.40
CYP2C19 P33261 1/20 0.40
NPC1 O15118 1/20 0.38
RAB9A P51151 1/20 0.38
SMN1; SMN2 Q16637 1/20 0.38
ALDH1A1 P00352 1/20 0.38
THRB P10828 1/20 0.37
ATM Q13315 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2681050 0.98 EPHX1 (0.47) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL1350834 0.94 EPHX1 (0.43) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL10900145 0.90 CHRM2 (0.38) EPHX1CYP19A1NAAAL3MBTL1CYP2C19
SCHEMBL28331691 0.89 EPHX1 (0.41) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL18253394 0.86 CYP2C19 (0.44) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL4743509 0.85 NAAA (0.47) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL18253417 0.85 CYP2C19 (0.43) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL18253398 0.85 CYP2C19 (0.50) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL18253338 0.85 EPHX1 (0.39) EPHX1CYP19A1NAAAHTTL3MBTL1
SCHEMBL27587439 0.85 CYP19A1 (0.47) EPHX1CYP19A1NAAAHTTL3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 216 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1558654-A4 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF FUJIFILM ELECTRONIC MATERIALS (US) 2006-04-05 EP claimed
EP-1558654-A2 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF Fujifilm Electronic Materials USA, Inc. (US) 2005-08-03 EP claimed
US-6916543-B2 Copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. (US) 2005-07-12 US claimed
US-20040137362-A1 Novel copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. 2004-07-15 US claimed
WO-2004040371-A2 NOVEL COPOLYMER AND PHOTORESIST COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2004-05-13 WO claimed
US-11820162-B2 Pretreatment liquid, ink set, base material for image recording, method of producing base material for image recording, image recording material, and image recording method FUJIFILM CORPORATION (JP) 2023-11-21 US disclosed
US-11820162-B2 Pretreatment liquid, ink set, base material for image recording, method of producing base material for image recording, image recording material, and image recording method FUJIFILM CORPORATION (JP) 2023-11-21 US disclosed
US-20230305403-A1 PATTERN FORMING METHOD, MANUFACTURING METHOD OF CIRCUIT BOARD, AND LAMINATE FUJIFILM CORPORATION (JP) 2023-09-28 US disclosed
US-20230261252-A1 INORGANIC SOLID ELECTROLYTE-CONTAINING COMPOSITION, SHEET FOR ALL-SOLID STATE SECONDARY BATTERY, AND ALL-SOLID STATE SECONDARY BATTERY, AND MANUFACTURING METHODS FOR SHEET FOR ALL-SOLID STATE SECONDARY BATTERY AND ALL-SOLID STATE SECONDARY BATTERY FUJIFILM CORPORATION (JP) 2023-08-17 US disclosed
WO-2023140386-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-07-27 WO disclosed
WO-2023112746-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-06-22 WO disclosed
US-20230194988-A1 TRANSFER FILM, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR CIRCUIT WIRE, AND MANUFACTURING METHOD FOR ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-06-22 US disclosed
EP-1558654-A4 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF FUJIFILM ELECTRONIC MATERIALS (US) 2006-04-05 EP disclosed
US-20050244441-A1 Cosmetic compositions UNILEVER HOME & PERSONAL CARE USA, DIVISION OF CONOPCO, INC. 2005-11-03 US disclosed
EP-1558654-A2 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF Fujifilm Electronic Materials USA, Inc. (US) 2005-08-03 EP disclosed
US-6916543-B2 Copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. (US) 2005-07-12 US disclosed
US-20040137362-A1 Novel copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. 2004-07-15 US disclosed
WO-2004040371-A2 NOVEL COPOLYMER AND PHOTORESIST COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2004-05-13 WO disclosed
US-6667285-B1 Branched-chain carboxylic acid monoalkyl ester with outstanding hydrolytic stability NEW JAPAN CHEMICAL CO., LTD. (JP) 2003-12-23 US disclosed
EP-1225213-A1 LUBRICATING OIL FOR REFRIGERATOR, HYDRAULIC FLUID COMPOSITION FOR REFRIGERATOR AND METHOD FOR LUBRICATION OF REFRIGERATOR NEW JAPAN CHEMICAL CO.,LTD. (JP) 2002-07-24 EP disclosed