SCHEMBL7865864

SCHEMBL7865864

CC(C)(c1ccccc1OC1CCCCO1)c1ccccc1OC1CCCCO1

nearest known ligand 0.41

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
KDM4C Q9H3R0 1/20 0.36
PDE4B Q07343 2/20 0.35
SLC6A3 Q01959 3/20 0.33
PTPN1 P18031 2/20 0.33
DHFR P00374 1/20 0.33
HRH3 Q9Y5N1 1/20 0.33
ALDH1A1 P00352 1/20 0.32
RBP4 P02753 2/20 0.32
MEN1 O00255 1/20 0.32
KMT2A Q03164 1/20 0.32
CYP2D6 P10635 2/20 0.31
SLC6A2 P23975 2/20 0.31
SLC6A4 P31645 2/20 0.31
L3MBTL1 Q9Y468 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7710565 0.91 ALDH1A1 (0.40) KDM4CPDE4BALDH1A1RBP4CYP2D6
SCHEMBL30788461 0.85 KDM4C (0.41) KDM4CPDE4BSLC6A3PTPN1DHFR
SCHEMBL6342508 0.85 KDM4C (0.41) KDM4CPDE4BSLC6A3PTPN1DHFR
SCHEMBL1603487 0.84 CYP2D6 (0.41) SLC6A3CYP2D6SLC6A2SLC6A4
SCHEMBL7240375 0.81 PDE4B (0.46) PDE4BSLC6A3PTPN1ALDH1A1SLC6A2
SCHEMBL7241320 0.81 ALDH1A1 (0.44) PDE4BSLC6A3ALDH1A1MEN1KMT2A
SCHEMBL16861328 0.78 SLC6A3 (0.36) PDE4BSLC6A3PTPN1RBP4MEN1
SCHEMBL16861336 0.78 SLC6A3 (0.36) PDE4BSLC6A3PTPN1RBP4MEN1
SCHEMBL954903 0.78 HPGD (0.38) KDM4CPDE4BPTPN1DHFRALDH1A1
SCHEMBL8067831 0.78 KDM4C (0.37) KDM4CPDE4BSLC6A3PTPN1DHFR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6303264-B1 PROFILE OF PATTERN OF QUARTER MICRON ORDER WITHOUT CAUSING FOOTING, WHILE RETAINING HIGH RESOLUTION ABILITY AND HIGH SENSITIVITY WAKO PURE CHEMICAL INDUSTRIES, LTD (JP) 2001-10-16 US disclosed
EP-0675410-B1 Resist composition for deep ultraviolet light WAKO PURE CHEM IND LTD (JP) 1999-08-04 EP disclosed
EP-0875787-A1 Method for reducing the substrate dependence of resist Wako Pure Chemical Industries, Ltd. (JP) 1998-11-04 EP disclosed
US-5780206-A USING AN ANTHRACENE DERIVATIVE AS AN ABSORBER ON HIGHLY REFLECTIVE SURFACES; ALKALI-SOLUBLE POLYMERS; GENERATION OF ACID CATALYSTS; FINE PATTERNS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1998-07-14 US disclosed
US-5695910-A RESIN BECOMES ALKALI SOLUBLE BY ELIMINATING PROTECTIVE GROUPS BY ACTION OF IN SITU GENERATED ACID WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1997-12-09 US disclosed
EP-0675410-A1 Resist composition for deep ultraviolet light WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1995-10-04 EP disclosed