SCHEMBL787053

SCHEMBL787053

CCC(C(C)OC(N)=O)[N+](=O)[O-]

nearest known ligand 0.36

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
LMNA P02545 2/20 0.36
CHRM2 P08172 1/20 0.36
CHRM4 P08173 1/20 0.36
CHRM5 P08912 1/20 0.36
CHRM1 P11229 1/20 0.36
CHRM3 P20309 1/20 0.36
CYP2C9 P11712 1/20 0.36
TSHR P16473 1/20 0.36
MAPT P10636 1/20 0.35
ALDH1A1 P00352 1/20 0.33
ALOX15 P16050 1/20 0.31
TDP1 Q9NUW8 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7573462 0.72 ALDH1A1 (0.38) TSHRALDH1A1
SCHEMBL225285 0.71 LMNA (0.43) LMNACHRM2CHRM4CHRM5CHRM1
SCHEMBL8747972 0.71
SCHEMBL8928296 0.70 LMNA (0.42) LMNACHRM2CHRM4CHRM5CHRM1
SCHEMBL10893130 0.70 LMNA (0.47) LMNACHRM2CHRM4CHRM5CHRM1
SCHEMBL29728540 0.70 LMNA (0.42) LMNACHRM2CHRM4CHRM5CHRM1
SCHEMBL29728550 0.70 LMNA (0.48) LMNACHRM2CHRM4CHRM5CHRM1
SCHEMBL4913990 0.70 ALDH1A1 (0.52) TSHRMAPTALDH1A1
SCHEMBL2918544 0.69
SCHEMBL28163483 0.68 LMNA (0.45) LMNACHRM2CHRM4CHRM5CHRM1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8568960-B2 Multiple exposure photolithography methods INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-29 US claimed
US-8236476-B2 Multiple exposure photolithography methods and photoresist compositions INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-08-07 US claimed
US-20120178027-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-07-12 US claimed
EP-2240828-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS AND PHOTORESIST COMPOSITIONS International Business Machines Corporation (US) 2010-10-20 EP claimed
WO-2009087029-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS AND PHOTORESIST COMPOSITIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-07-16 WO claimed
US-20090176174-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS AND PHOTORESIST COMPOSTIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-07-09 US claimed
US-9235119-B2 Exposure photolithography methods GLOBALFOUNDRIES INC. (KY) 2016-01-12 US disclosed
US-20140349237-A1 EXPOSURE PHOTOLITHOGRAPHY METHODS GLOBALFOUNDRIES U.S. INC. 2014-11-27 US disclosed
US-8846296-B2 Photoresist compositions INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2014-09-30 US disclosed
US-8568960-B2 Multiple exposure photolithography methods INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-29 US disclosed
US-8394573-B2 Photoresist compositions and methods for shrinking a photoresist critical dimension INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-03-12 US disclosed
US-20120214099-A1 PHOTORESIST COMPOSITIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-08-23 US disclosed
US-8236476-B2 Multiple exposure photolithography methods and photoresist compositions INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-08-07 US disclosed
US-20120070787-A1 PHOTORESIST COMPOSITIONS AND METHODS FOR SHRINKING A PHOTORESIST CRITICAL DIMENSION INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-03-22 US disclosed
US-7838200-B2 Photoresist compositions and method for multiple exposures with multiple layer resist systems INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-11-23 US disclosed
EP-2240828-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS AND PHOTORESIST COMPOSITIONS International Business Machines Corporation (US) 2010-10-20 EP disclosed
WO-2009087029-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS AND PHOTORESIST COMPOSITIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-07-16 WO disclosed
US-20090176174-A1 MULTIPLE EXPOSURE PHOTOLITHOGRAPHY METHODS AND PHOTORESIST COMPOSTIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-07-09 US disclosed
WO-2009074522-A1 PHOTORESIST COMPOSITIONS AND METHOD FOR MULTIPLE EXPOSURES WITH MULTIPLE LAYER RESIST SYSTEMS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-06-18 WO disclosed
US-20090155715-A1 PHOTORESIST COMPOSITIONS AND METHOD FOR MULTIPLE EXPOSURES WITH MULTIPLE LAYER RESIST SYSTEMS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-06-18 US disclosed