SCHEMBL8078874

SCHEMBL8078874

CN(C)c1ccc(S(OS(=O)(=O)C(F)(F)F)(c2ccc(OC(C)(C)C)cc2)c2ccc(OC(C)(C)C)cc2)cc1

nearest known ligand 0.37

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 1/20 0.36
ALDH1A1 P00352 1/20 0.36
HPGD P15428 1/20 0.36
ALOX15 P16050 1/20 0.36
HSD17B10 Q99714 1/20 0.36
CA9 Q16790 3/20 0.35
CA12 O43570 2/20 0.35
CA2 P00918 2/20 0.35
CA1 P00915 1/20 0.35
CA4 P22748 1/20 0.35
CNR2 P34972 1/20 0.35
NR3C1 P04150 1/20 0.34
FFAR1 O14842 1/20 0.34
ALDH3A1 P30838 1/20 0.34
HDAC3 O15379 1/20 0.34
HDAC4 P56524 1/20 0.34
HDAC1 Q13547 1/20 0.34
HDAC7 Q8WUI4 1/20 0.34
HDAC2 Q92769 1/20 0.34
HDAC10 Q969S8 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8069552 1.00 KDM4E (0.36) KDM4EALDH1A1HPGDALOX15HSD17B10
SCHEMBL66113 0.90 HSD11B1 (0.38) CA2CA1CNR2NR3C1HTR2A
SCHEMBL8592504 0.89 ALDH1A1 (0.43) KDM4EALDH1A1HPGDALOX15HSD17B10
SCHEMBL64049 0.86 HSD11B1 (0.41) CNR2NR3C1MEN1KMT2ABCHE
SCHEMBL63999 0.86 HSD11B1 (0.41) CNR2NR3C1MEN1KMT2ABCHE
SCHEMBL8494198 0.85 BCHE (0.46) ALDH1A1CA9CA2CA1FFAR1
SCHEMBL8318837 0.85 ALDH1A1 (0.38) KDM4EALDH1A1HPGDALOX15HSD17B10
SCHEMBL8324855 0.85 ALDH1A1 (0.38) KDM4EALDH1A1HPGDALOX15HSD17B10
SCHEMBL8497205 0.85 HSD11B1 (0.47) ALDH1A1CA2CA1NPC1POLB
SCHEMBL8651578 0.83 HDAC3 (0.36) KDM4EALDH1A1HPGDALOX15HSD17B10

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-5569784-A FINE PATTERN; PREVENTS POST-EXPOSURE DELAY SHIN-ETSU CHEMICAL CO., LTD. (JP) 1996-10-29 US claimed
US-6106993-A HIGHLY SENSITIVE TO ACTINIC RADIATION SUCH AS DEEP-UV, ELECTRON BEAM AND X-RAY, CAN BE DEVELOPED WITH ALKALINE AQUEOUS SOLUTION TO FORM A PATTERN, AND IS THUS SUITABLE FOR USE IN A FINE PATTERNING TECHNIQUE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-08-22 US disclosed
EP-0665220-B1 Novel sulfonium salt and chemically amplified positive resist composition SHINETSU CHEMICAL CO (JP) 1999-04-07 EP disclosed
EP-0667338-B1 Sulfonium salt and resist composition SHINETSU CHEMICAL CO (JP) 1998-01-07 EP disclosed
US-5691112-A P-TOLUENESULFONIC ACID TRIS(P-TERT-BUTOXYPHENYL) SULFONIUM AS PHOTOSENSITIVE ACID GENERATOR; FORMING SOLUBLE SURFACE LAYER SHIN-ETSU CHEMICAL CO., LTD. (JP) 1997-11-25 US disclosed
US-5633409-A POSITIVE RESISTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 1997-05-27 US disclosed
US-5569784-A FINE PATTERN; PREVENTS POST-EXPOSURE DELAY SHIN-ETSU CHEMICAL CO., LTD. (JP) 1996-10-29 US disclosed
EP-0667338-A1 Sulfonium salt and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 1995-08-16 EP disclosed
EP-0665220-A1 Novel sulfonium salt and chemically amplified positive resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 1995-08-02 EP disclosed