SCHEMBL825544

SCHEMBL825544

CCC(C)C(=O)Oc1ccc(C(=O)c2ccccc2)cc1

nearest known ligand 0.71

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
ELANE P08246 10/20 0.71
ALDH1A1 P00352 2/20 0.51
RAB9A P51151 2/20 0.51
GAA P10253 2/20 0.47
ABCB1 P08183 1/20 0.47
SMN1; SMN2 Q16637 2/20 0.47
MAPT P10636 2/20 0.47
HTT P42858 2/20 0.47
LMNA P02545 1/20 0.47
MAPK1 P28482 1/20 0.47
L3MBTL1 Q9Y468 1/20 0.47
MEN1 O00255 2/20 0.47
KMT2A Q03164 2/20 0.47
NPC1 O15118 1/20 0.47

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL825436 0.88 KMT2A (0.54) ELANEALDH1A1RAB9AMAPTLMNA
SCHEMBL14996055 0.87 ELANE (0.50) ELANEALDH1A1RAB9AGAAMAPT
SCHEMBL650639 0.87 ELANE (0.50) ELANEALDH1A1RAB9AGAAMAPT
SCHEMBL17617137 0.87 ELANE (0.50) ELANEALDH1A1RAB9AGAAMAPT
SCHEMBL825541 0.87 ELANE (0.54) ELANEALDH1A1RAB9ASMN1; SMN2MAPT
SCHEMBL825605 0.86 ELANE (0.53) ELANEALDH1A1RAB9ASMN1; SMN2MAPT
SCHEMBL19862709 0.86 ELANE (0.61) ELANEALDH1A1RAB9AGAAABCB1
SCHEMBL9338697 0.85 MAPT (0.57) ELANEALDH1A1MAPTHTTMAPK1
SCHEMBL10415112 0.85 MAPT (0.57) ELANEALDH1A1MAPTHTTMAPK1
SCHEMBL14827291 0.84 NPY5R (0.50) ELANEALDH1A1RAB9AMAPK1L3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 49 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9915870-B2 Pattern forming method, composition kit and resist film, and method for producing electronic device using them, and electronic device FUJIFILM CORPORATION (JP) 2018-03-13 US disclosed
US-9904168-B2 Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank provided with actinic ray-sensitive or radiation-sensitive film, pattern forming method, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2018-02-27 US disclosed
US-9651863-B2 Pattern forming method, active light sensitive or radiation sensitive resin composition, resist film, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2017-05-16 US disclosed
US-9632410-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, resist-coated mask blank, photomask and pattern forming method, and method for producing electronic device using them, and electronic device FUJIFILM CORPORATION (JP) 2017-04-25 US disclosed
US-9557643-B2 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, manufacturing method of electronic device using the same and electronic device FUJIFILM CORPORATION (JP) 2017-01-31 US disclosed
US-9551933-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, using the same, pattern forming method, manufacturing method of electronic device, and electronic device FUJIFILM CORPORATION (JP) 2017-01-24 US disclosed
US-9527809-B2 Compound, actinic ray-sensitive or radiation-sensitive resin composition, resist film, and pattern formation method, and method for manufacturing electronic device using same, and electronic device FUJIFILM CORPORATION (JP) 2016-12-27 US disclosed
US-20160320700-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK PROVIDED WITH ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-11-03 US disclosed
US-9470980-B2 Pattern-forming method, electron beam-sensitive or extreme ultraviolet radiation-sensitive resin composition, resist film, manufacturing method of electronic device using them and electronic device FUJIFILM CORPORATION (JP) 2016-10-18 US disclosed
US-9448477-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, manufacturing method of electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2016-09-20 US disclosed
US-7940355-B2 Cellulose acylate film, and polarizing plate and liquid crystal display device using the same FUJIFILM CORPORATION (JP) 2011-05-10 US disclosed
US-7678507-B2 Latent holographic media and method INPHASE TECHNOLOGIES, INC. (US) 2010-03-16 US disclosed
US-20090103014-A1 Cellulose Acylate Film, and Polarizing Plate and Liquid Crystal Display Device Using the Same FUJI FILM CORPORATION (JP) 2009-04-23 US disclosed
US-7494611-B2 Cellulose ester film, cellulose ester dope, protective film of polarizing plate and polarizing plate KONICA CORPORATION (JP) 2009-02-24 US disclosed
US-7445831-B2 Radiation curable low stress relaxation elastomeric materials THE PROCTER & GAMBLE COMPANY (US) 2008-11-04 US disclosed
US-20080241749-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed
US-20080032067-A1 Cellulose acylate film, and polarizing plate and liquid crystal display device using the same FUJIFILM CORPORATION (JP) 2008-02-07 US disclosed
US-7306895-B2 Pattern forming method, image forming method, fine particle adsorption pattern forming method, conductive pattern forming method, pattern forming material and planographic printing plate FUJIFILM CORPORATION (JP) 2007-12-11 US disclosed
US-7279195-B2 Method of forming metal fine particle pattern and method of forming electroconductive pattern FUJIFILM CORPORATION (JP) 2007-10-09 US disclosed
US-20070166625-A1 Latent holographic media and method INPHASE TECHNOLOGIES, INC. (US) 2007-07-19 US disclosed