SCHEMBL8514896

SCHEMBL8514896

O=C1C(F)C(F)(F)C(F)(F)C1(F)F

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4931013 0.69
SCHEMBL7055091 0.67
SCHEMBL252911 0.65
SCHEMBL7632251 0.63
SCHEMBL28408888 0.62
SCHEMBL7095253 0.61
SCHEMBL4350952 0.55
SCHEMBL2146960 0.54
SCHEMBL3746961 0.54
SCHEMBL9936034 0.52 MEN1 (0.31)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2960224-B1 HIGH-PURITY 1H-HEPTAFLUOROCYCLOPENTENE ZEON CORP (JP) 2019-03-27 EP disclosed
US-9944852-B2 High-purity 1H-heptafluorocyclopentene ZEON CORPORATION (JP) 2018-04-17 US disclosed
EP-2643732-B1 PROCESS FOR FORMING UNEVEN STRUCTURE ON SURFACE OF SURFACE LAYER OF CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, AND PROCESS FOR PRODUCING CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER HAVING UNEVEN STRUCTURE FORMED ON SURFACE OF SURFACE LAYER OF SAME CANON KK (JP) 2018-01-10 EP disclosed
US-20160002530-A1 HIGH-PURITY 1H-HEPTAFLUOROCYCLOPENTENE ZEON CORPORATION (JP) 2016-01-07 US disclosed
EP-2960224-A1 HIGH-PURITY 1H-HEPTAFLUOROCYCLOPENTENE Zeon Corporation (JP) 2015-12-30 EP disclosed
US-9114565-B2 Process for forming uneven structure on surface of surface layer of cylindrical electrophotographic photosensitive member, and process for producing cylindrical electrophotographic photosensitive member having uneven structure formed on surface of surface layer of same CANON KABUSHIKI KAISHA (JP) 2015-08-25 US disclosed
EP-2643732-A1 PROCESS FOR FORMING UNEVEN STRUCTURE ON SURFACE OF SURFACE LAYER OF CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, AND PROCESS FOR PRODUCING CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER HAVING UNEVEN STRUCTURE FORMED ON SURFACE OF SURFACE LAYER OF SAME Canon Kabushiki Kaisha (JP) 2013-10-02 EP disclosed
US-20130221560-A1 PROCESS FOR FORMING UNEVEN STRUCTURE ON SURFACE OF SURFACE LAYER OF CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, AND PROCESS FOR PRODUCING CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER HAVING UNEVEN STRUCTURE FORMED ON SURFACE OF SURFACE LAYER OF SAME CANON KABUSHIKI KAISHA (JP) 2013-08-29 US disclosed
WO-2012070663-A1 PROCESS FOR FORMING UNEVEN STRUCTURE ON SURFACE OF SURFACE LAYER OF CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, AND PROCESS FOR PRODUCING CYLINDRICAL ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER HAVING UNEVEN STRUCTURE FORMED ON SURFACE OF SURFACE LAYER OF SAME CANON KABUSHIKI KAISHA (JP) 2012-05-31 WO disclosed