SCHEMBL8520339

SCHEMBL8520339

[CH]=C(C)c1ccc(O)cc1

nearest known ligand 0.60

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ESR1 P03372 9/20 0.52
ESR2 Q92731 6/20 0.52
HSD17B1 P14061 1/20 0.48
MAPT P10636 5/20 0.48
LMNA P02545 5/20 0.48
HSD17B10 Q99714 4/20 0.48
MEN1 O00255 4/20 0.48
KMT2A Q03164 4/20 0.48
CYP3A4 P08684 3/20 0.48
ALOX15 P16050 3/20 0.48
HIF1A Q16665 3/20 0.48
NR3C1 P04150 2/20 0.48
TP53 P04637 2/20 0.48
CYP1A2 P05177 2/20 0.48
ADORA3 P0DMS8 2/20 0.48
CYP2D6 P10635 2/20 0.48
CYP2C9 P11712 2/20 0.48
CYP2C19 P33261 2/20 0.48
OPRD1 P41143 2/20 0.48
GAA P10253 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11742294 0.77 ALDH1A1 (0.50) MAPTLMNAMEN1KMT2AGAA
Dimethylstilbestrol SCHEMBL13339102 0.75 ESR1 (0.74) ESR1ESR2HSD17B1MAPTLMNA
Dimethylstilbestrol SCHEMBL125634 0.75 ESR1 (0.74) ESR1ESR2HSD17B1MAPTLMNA
SCHEMBL3656765 0.75 ESR1 (0.57) ESR1ESR2HSD17B1MAPTLMNA
SCHEMBL1071921 0.75 ESR1 (0.57) ESR1ESR2HSD17B1MAPTLMNA
Dimethylstilbestrol SCHEMBL125635 0.75 ESR1 (0.74) ESR1ESR2HSD17B1MAPTLMNA
SCHEMBL11608886 0.74 CES2 (0.48) MAPTLMNAMEN1KMT2ACYP3A4
SCHEMBL4338484 0.74 CES2 (0.48) MAPTLMNAMEN1KMT2AALOX15
SCHEMBL11745079 0.74 CES2 (0.48) MAPTLMNACA1CA2NPC1
Hydroquinone SCHEMBL17202556 0.73 CYP3A4 (0.73) ESR1ESR2HSD17B1MAPTLMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 29 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0480311-B1 Radiation-sensitive mixture containing an acid-cleavable group and process for obtaining relief patterns and images BASF AG (DE) 1998-07-08 EP claimed
EP-0342495-B1 Light-sensitive composition and process for the formation of relief patterns BASF AG (DE) 1994-01-12 EP claimed
EP-0342494-B1 Light-sensitive composition and process for the formation of relief patterns BASF AG (DE) 1993-12-29 EP claimed
EP-0342496-B1 Light-sensitive composition, and process for the formation of relief patterns BASF AG (DE) 1993-12-29 EP claimed
EP-0342498-B1 Light-sensitive negative or positive composition, and process for the formation of relief patterns BASF AG (DE) 1993-12-22 EP claimed
EP-0472029-A1 Light-sensitive composition and process for the formation of relief pattern BASF Aktiengesellschaft (DE) 1992-02-26 EP claimed
EP-0342494-A2 Light-sensitive composition and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP claimed
EP-0342496-A2 Light-sensitive composition, and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP claimed
EP-0342498-A2 Light-sensitive negative or positive composition, and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP claimed
EP-0342495-A2 Light-sensitive composition and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP claimed
EP-0520265-B1 Positive working radiation-sensitive composition with disulfone acid generators BASF AG (DE) 1999-11-17 EP disclosed
EP-0553737-B1 Radiation-sensitive composition BASF AG (DE) 1999-09-22 EP disclosed
EP-0540965-B1 Positive light sensitive composition and process for the formation of relief pattern BASF AG (DE) 1999-06-09 EP disclosed
EP-0480311-B1 Radiation-sensitive mixture containing an acid-cleavable group and process for obtaining relief patterns and images BASF AG (DE) 1998-07-08 EP disclosed
EP-0508174-B1 Radiation sensitive mixture, containing groups which are labile in acid environment and method for fabrication of relief patterns and relief images BASF AG (DE) 1997-09-03 EP disclosed
EP-0424766-A2 Radiation-sensitive composition and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1991-05-02 EP disclosed
EP-0342498-A2 Light-sensitive negative or positive composition, and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP disclosed
EP-0342495-A2 Light-sensitive composition and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP disclosed
EP-0342496-A2 Light-sensitive composition, and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP disclosed
EP-0342494-A2 Light-sensitive composition and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1989-11-23 EP disclosed