SCHEMBL8569001

SCHEMBL8569001

CCCC[N+](CCCC)(Cc1ccccc1)Cc1ccccc1

nearest known ligand 0.58

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
DNM1 Q05193 2/20 0.58
MEN1 O00255 2/20 0.56
KMT2A Q03164 2/20 0.56
TP53 P04637 2/20 0.56
SMN1; SMN2 Q16637 2/20 0.56
MAPK1 P28482 1/20 0.56
HTT P42858 2/20 0.55
CYP1A2 P05177 1/20 0.49
KDM4E B2RXH2 1/20 0.46
ALDH1A1 P00352 1/20 0.46
TDP1 Q9NUW8 1/20 0.46
SLC22A1 O15245 1/20 0.46
CNR2 P34972 2/20 0.42
BCHE P06276 1/20 0.41
ACHE P22303 1/20 0.41
SIGMAR1 Q99720 1/20 0.41
CHRNB4 P30926 1/20 0.41
CHRNA3 P32297 1/20 0.41
CHRNA7 P36544 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Hydrochloric Acid SCHEMBL1243916 0.98 MEN1 (0.59) DNM1MEN1KMT2ATP53SMN1; SMN2
Iodide SCHEMBL5091862 0.98 DNM1 (0.56) DNM1MEN1KMT2ATP53SMN1; SMN2
Bromide SCHEMBL5088529 0.98 DNM1 (0.59) DNM1MEN1KMT2ATP53SMN1; SMN2
Water SCHEMBL11128576 0.98 DNM1 (0.56) DNM1MEN1KMT2ATP53SMN1; SMN2
Hydrogen Sulfide SCHEMBL5998244 0.96 DNM1 (0.58) DNM1MEN1KMT2ATP53SMN1; SMN2
SCHEMBL5293784 0.96 DNM1 (0.58) DNM1MEN1KMT2ATP53SMN1; SMN2
SCHEMBL81000 0.96 DNM1 (0.58) DNM1MEN1KMT2ATP53SMN1; SMN2
Hydrochloric Acid SCHEMBL635378 0.94 MEN1 (0.59) DNM1MEN1KMT2ATP53SMN1; SMN2
Iodide SCHEMBL239944 0.94 DNM1 (0.56) DNM1MEN1KMT2ATP53SMN1; SMN2
Bromide SCHEMBL240143 0.94 DNM1 (0.59) DNM1MEN1KMT2ATP53SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 37 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12421396-B2 Silica particles and method for producing the same FUJIFILM BUSINESS INNOVATION CORP. (JP) 2025-09-23 US disclosed
EP-4250014-B1 ELECTROSTATIC CHARGE IMAGE DEVELOPING TONER, ELECTROSTATIC CHARGE IMAGE DEVELOPER, TONER CARTRIDGE, PROCESS CARTRIDGE, IMAGE FORMING APPARATUS, AND IMAGE FORMING METHOD FUJIFILM BUSINESS INNOVATION CORP (JP) 2025-09-03 EP disclosed
EP-4343438-B1 ELECTROSTATIC CHARGE IMAGE DEVELOPING TONER, ELECTROSTATIC CHARGE IMAGE DEVELOPER, TONER CARTRIDGE, PROCESS CARTRIDGE, IMAGE FORMING APPARATUS, AND IMAGE FORMING METHOD FUJIFILM BUSINESS INNOVATION CORP (JP) 2025-06-04 EP disclosed
US-12215033-B2 Silica particles comprising nitrogen element-containing compound containing molybdenum element FUJIFILM BUSINESS INNOVATION CORP. (JP) 2025-02-04 US disclosed
US-12162769-B2 Silica particles and manufacturing method thereof FUJIFILM BUSINESS INNOVATION CORP. (JP) 2024-12-10 US disclosed
US-12077443-B2 Silica particles and method for producing the same FUJIFILM BUSINESS INNOVATION CORP. (JP) 2024-09-03 US disclosed
US-20240118641-A1 ELECTROSTATIC CHARGE IMAGE DEVELOPING TONER, ELECTROSTATIC CHARGE IMAGE DEVELOPER, TONER CARTRIDGE, PROCESS CARTRIDGE, IMAGE FORMING APPARATUS, AND IMAGE FORMING METHOD FUJIFILM BUSINESS INNOVATION CORP. (JP) 2024-04-11 US disclosed
US-20240118640-A1 ELECTROSTATIC CHARGE IMAGE DEVELOPING TONER, ELECTROSTATIC CHARGE IMAGE DEVELOPER, TONER CARTRIDGE, PROCESS CARTRIDGE, IMAGE FORMING APPARATUS, AND IMAGE FORMING METHOD FUJIFILM BUSINESS INNOVATION CORP. (JP) 2024-04-11 US disclosed
EP-4345540-A1 ELECTROSTATIC CHARGE IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APPARATUS, AND IMAGE FORMING METHOD FUJIFILM Business Innovation Corp. (JP) 2024-04-03 EP disclosed
EP-4343437-A1 ELECTROSTATIC CHARGE IMAGE DEVELOPING TONER, ELECTROSTATIC CHARGE IMAGE DEVELOPER, TONER CARTRIDGE, PROCESS CARTRIDGE, IMAGE FORMING APPARATUS, AND IMAGE FORMING METHOD FUJIFILM Business Innovation Corp. (JP) 2024-03-27 EP disclosed
US-20170059992-A1 RESIST PATTERN-FORMING METHOD AND CHEMICALLY AMPLIFIED RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2017-03-02 US disclosed
US-20160041465-A1 PATTERN FORMING METHOD, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-02-11 US disclosed
US-20160011517-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD OF MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-01-14 US disclosed
US-20160011517-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD OF MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-01-14 US disclosed
CN-100422193-C Method for producing thiocarboxylate silane GEN ELECTRIC (US) 2008-10-01 CN disclosed
US-5705674-A Process for preparing ortho-nitrobenzonitriles HOECHST AKTIENGESELLSCHAFT (DE) 1998-01-06 US disclosed
EP-0619300-B1 Process for the preparation of halogenmethylbenzoyl cyanides and halogenmethyl benzoylcyanides BASF AG (DE) 1996-12-27 EP disclosed
US-5510528-A Preparation of halomethylbenzoly cyanides and novel halomethylbenzoyl cyanides BASF AKTIENGESELLSCHAFT (DE) 1996-04-23 US disclosed
US-5446199-A Preparation of halomethylbenzoyl cyanides and novel halomethylbenzoyl cyanides BASF AKTIENGESELLSCHAFT (DE) 1995-08-29 US disclosed
EP-0619300-A2 Process for the preparation of halogenmethylbenzoyl cyanides and halogenmethyl benzoylcyanides BASF Aktiengesellschaft (DE) 1994-10-12 EP disclosed