SCHEMBL867266

SCHEMBL867266

COC(O)NC(N)=O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11573768 0.78 TSHR (0.35)
SCHEMBL21538628 0.76
SCHEMBL36898 0.76
SCHEMBL13408640 0.76
Methoxymethane SCHEMBL27630769 0.76 CAD (0.35)
SCHEMBL10899226 0.74
SCHEMBL11851799 0.74
SCHEMBL9293414 0.70 POLB (0.39)
SCHEMBL238196 0.70 SLC1A3 (0.38)
SCHEMBL10571804 0.70 CAD (0.32)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 37 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20060137104-A1 Method of producing fabric ZHANG YU-GAO 2006-06-29 US claimed
EP-1492918-A4 METHOD OF PRODUCING FABRIC GUANGDONG ESQUEL KNITTERS CO L (CN) 2006-06-21 EP claimed
EP-1492918-A2 METHOD OF PRODUCING FABRIC Guangdong Esquel Kniiters Co., Ltd. (CN) 2005-01-05 EP claimed
WO-2003060222-A2 METHOD OF PRODUCING FABRIC GUANGDONG ESQUEL KNITTERS CO., LTD. (CN) 2003-07-24 WO claimed
US-20030135932-A1 Method of producing fabric GUANGDONG ESQUEL KNITTERS CO., LTD. (CN) 2003-07-24 US claimed
US-20030129538-A1 Method for eliminating corner round profile of the RELACS process MACRONIX INTERNATIONAL CO., LTD. 2003-07-10 US claimed
JP-56104958-A None JP disclosed
US-9304399-B2 Resist composition and method for producing semiconductor device SONY CORPORATION (JP) 2016-04-05 US disclosed
US-20140273513-A1 RESIST COMPOSITION AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE SONY CORPORATION (JP) 2014-09-18 US disclosed
US-20140248777-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE SONY CORPORATION (JP) 2014-09-04 US disclosed
US-8765353-B2 Resist composition and method for producing semiconductor device SONY CORPORATION (JP) 2014-07-01 US disclosed
US-20120077343-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE SONY CORPORATION (JP) 2012-03-29 US disclosed
US-7922776-B2 Shrinkage inhibition; wrinkle resistance; contacting cellulose with enzyme; then overcoating with polymer ZHANG YU-GAO 2011-04-12 US disclosed
US-20030077539-A1 Negative- acting aqueous photoresist composition MERCK PATENT GMBH (DE) 2003-04-24 US disclosed
WO-2003029900-A1 NEGATIVE-ACTING AQUEOUS PHOTORESIST COMPOSITION CLARIANT INTERNATIONAL LTD (CH) 2003-04-10 WO disclosed
US-20020037476-A1 Resist pattern forming method, frame plating method and manufacturing method of thin-film magnetic head TDK CORPORATION (JP) 2002-03-28 US disclosed
US-6274289-B1 Chemical resist thickness reduction process ADVANCED MICRO DEVICES, INC. 2001-08-14 US disclosed
US-5306435-A Dimensional stability, shrinkage inhibition during washing NIHON JUNYAKU CO., LTD. (JP) 1994-04-26 US disclosed
JP-S56104958-A FIRE RETARDANT GLASS FIBER STRUCTURE AND ITS BINDER SANWA CHEM:KK 1981-08-21 JP disclosed
US-3963668-A GLASS FIBERS, ALKOXYMETHYL UREAS BASF AKTIENGESELLSCHAFT (DT) 1976-06-15 US disclosed