SCHEMBL967665

SCHEMBL967665

CCCCOC(=O)c1ccccc1C(=O)O.[Cu]

nearest known ligand 0.83

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TSHR P16473 7/20 0.83
TDP1 Q9NUW8 3/20 0.83
L3MBTL1 Q9Y468 2/20 0.83
CYP3A4 P08684 3/20 0.75
MAPK1 P28482 2/20 0.75
TP53 P04637 1/20 0.75
ALDH1A1 P00352 9/20 0.73
LMNA P02545 1/20 0.73
HSD17B10 Q99714 2/20 0.67
KDM4E B2RXH2 2/20 0.59
POLB P06746 1/20 0.59
SMN1; SMN2 Q16637 2/20 0.51
CA2 P00918 1/20 0.51
CYP1A2 P05177 1/20 0.51
CYP2C19 P33261 1/20 0.51

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Benzene SCHEMBL3679548 0.98 TSHR (0.86) TSHRTDP1L3MBTL1CYP3A4MAPK1
SCHEMBL29649180 0.98 TSHR (0.86) TSHRTDP1L3MBTL1CYP3A4MAPK1
Phthalic Acid SCHEMBL27849166 0.98 TSHR (0.86) TSHRTDP1L3MBTL1CYP3A4MAPK1
SCHEMBL151027 0.98 TSHR (0.86) TSHRTDP1L3MBTL1CYP3A4MAPK1
Dibutyl Phthalate SCHEMBL2220638 0.98 TSHR (0.86) TSHRTDP1L3MBTL1CYP3A4MAPK1
Dibutyl Phthalate SCHEMBL27849163 0.98 TSHR (0.86) TSHRTDP1L3MBTL1CYP3A4MAPK1
SCHEMBL27708612 0.97 TSHR (0.83) TSHRTDP1L3MBTL1CYP3A4MAPK1
SCHEMBL28435163 0.97 TSHR (0.83) TSHRTDP1L3MBTL1CYP3A4MAPK1
SCHEMBL28271712 0.97 TSHR (0.83) TSHRTDP1L3MBTL1CYP3A4MAPK1
SCHEMBL11206095 0.97 TSHR (0.83) TSHRTDP1L3MBTL1CYP3A4MAPK1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 20 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7867676-B2 Copper containing hole blocking layer photoconductors XEROX CORPORATION (US) 2011-01-11 US claimed
US-20090035675-A1 COPPER CONTAINING HOLE BLOCKING LAYER PHOTOCONDUCTORS XEROX CORPORATION (US) 2009-02-05 US claimed
US-20250263639-A1 Cleaning Solution, Method For Cleaning Substrate, And Method For Forming Metal Containing Film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-08-21 US disclosed
CN-119384154-A Composite material, preparation method thereof and light-emitting device 广东聚华新型显示研究院 2025-01-28 CN disclosed
CN-117164875-A Preparation method of tubular metal copper phthalocyanine polymer and cyclic carbonate 浙江理工大学 2023-12-05 CN disclosed
US-20230333469-A1 FILM FORMING COMPOSITION FOR LITHOGRAPHY, RESIST PATTERN FORMATION METHOD, AND CIRCUIT PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2023-10-19 US disclosed
CN-116710500-A Polymer, composition, method for producing polymer, composition for forming film, resist composition, method for forming resist pattern, radiation-sensitive composition, composition for forming underlayer film for lithography, method for producing underlayer film for lithography, method for forming circuit pattern, and composition for forming optical member 三菱瓦斯化学株式会社 2023-09-05 CN disclosed
CN-116194502-A Polymer, composition, method for producing polymer, composition, film-forming composition, resist composition, radiation-sensitive composition, underlayer film-forming composition for lithography, resist pattern-forming method, method for producing underlayer film for lithography, circuit pattern-forming method, and composition for forming optical member 三菱瓦斯化学株式会社 2023-05-30 CN disclosed
CN-115836045-A Composition for forming photoresist, method for forming resist pattern, and method for forming circuit pattern 三菱瓦斯化学株式会社 2023-03-21 CN disclosed
WO-2022158335-A1 POLYMER, COMPOSITION, METHOD FOR PRODUCING POLYMER, FILM-FORMING COMPOSITION, RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, RADIATION-SENSITIVE COMPOSITION, COMPOSITION FOR FORMING UNDERLAYER FILM FOR LITHOGRAPHY, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, METHOD FOR FORMING CIRCUIT PATTERN, AND COMPOSITION FOR FORMING OPTICAL MEMBER 三菱瓦斯化学株式会社 2022-07-28 WO disclosed
CN-113429429-A Production method of benzimidazole-2-methyl carbamate-8-hydroxyquinoline copper 苏州华道生物药业股份有限公司 2021-09-24 CN disclosed
CN-113302223-A Film-forming composition, resist composition, radiation-sensitive composition, method for producing amorphous film, method for forming resist pattern, composition for forming underlayer film for lithography, method for producing underlayer film for lithography, and method for forming circuit pattern 三菱瓦斯化学株式会社 2021-08-24 CN disclosed
CN-113286841-A Polycyclic polyphenol resin and method for producing polycyclic polyphenol resin 三菱瓦斯化学株式会社 2021-08-20 CN disclosed
CN-105623500-B The weatherability coating composition of normal temperature cure 关西涂料株式会社 2019-10-11 CN disclosed
CN-106461831-B Near infrared ray absorbing composition, near infrared ray cut-off filter and its manufacturing method, solid-state imager, camera module 富士胶片株式会社 2019-04-09 CN disclosed
US-9011890-B2 Antibacterial sol-gel coating solution QINHUANGDAO YIPENG SPECIAL GLASS CO., LTD. (CN) 2015-04-21 US disclosed
US-7867676-B2 Copper containing hole blocking layer photoconductors XEROX CORPORATION (US) 2011-01-11 US disclosed
US-20090035675-A1 COPPER CONTAINING HOLE BLOCKING LAYER PHOTOCONDUCTORS XEROX CORPORATION (US) 2009-02-05 US disclosed
US-20080305153-A1 Antibacterial Sol-Gel Coating Solution, Method for Preparing Antibacterial Sol-Gel Coating Solution, Antibacterial Articles, and Method and Equipments for Preparing Antibacterial Articles QINHUANGDAO YIPENG SPECIAL GLASS CO, LTD (CN) 2008-12-11 US disclosed
EP-1975132-A1 ANTIBACTERIAL SOL-GEL COATING SOLUTION, METHOD FOR PREPARING ANTIBACTERIAL SOL-GEL COATING SOLUTION, ANTIBACTERIAL ARTICLES, AND METHOD AND EQUIPMENTS FOR PREPARING ANTIBACTERIAL ARTICLES Qinhuangdao Yipeng Special Glass Co., Ltd (CN) 2008-10-01 EP disclosed