SCHEMBL9769953

SCHEMBL9769953

[AlH3].[Cu].[SiH4].[Ti]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27562750 0.89
SCHEMBL27595635 0.89
SCHEMBL29463678 0.87
SCHEMBL28047372 0.87
SCHEMBL27805210 0.87
SCHEMBL472161 0.87
SCHEMBL261674 0.87
SCHEMBL29199128 0.87
SCHEMBL2789643 0.87
SCHEMBL27813861 0.87

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-118497838-A Method for preparing prefabricated aluminum-silicon-copper-titanium alloy in short process 黄治齐 2024-08-16 CN claimed
US-11670685-B2 Doping activation and ohmic contact formation in a SiC electronic device, and SiC electronic device STMICROELECTRONICS S.R.L. (IT) 2023-06-06 US claimed
US-20250176235-A1 OHMIC CONTACT FORMATION IN A SIC-BASED ELECTRONIC DEVICE STMICROELECTRONICS INTERNATIONAL N.V. (CH) 2025-05-29 US disclosed
US-12249624-B2 Ohmic contact formation in a SiC-based electronic device STMICROELECTRONICS S.R.L. (IT) 2025-03-11 US disclosed
US-20250022919-A1 DOPING ACTIVATION AND OHMIC CONTACT FORMATION IN A SiC ELECTRONIC DEVICE, AND SiC ELECTRONIC DEVICE STMICROELECTRONICS S.R.L. (IT) 2025-01-16 US disclosed
CN-118497838-A Method for preparing prefabricated aluminum-silicon-copper-titanium alloy in short process 黄治齐 2024-08-16 CN disclosed
CN-118497838-A Method for preparing prefabricated aluminum-silicon-copper-titanium alloy in short process 黄治齐 2024-08-16 CN disclosed
CN-118497838-A Method for preparing prefabricated aluminum-silicon-copper-titanium alloy in short process 黄治齐 2024-08-16 CN disclosed
US-12051725-B2 Doping activation and ohmic contact formation in a SiC electronic device, and SiC electronic device STMICROELECTRONICS S.R.L. (IT) 2024-07-30 US disclosed
US-20230343831-A1 DOPING ACTIVATION AND OHMIC CONTACT FORMATION IN A SiC ELECTRONIC DEVICE, AND SiC ELECTRONIC DEVICE STMICROELECTRONICS S.R.L. (IT) 2023-10-26 US disclosed
US-11670685-B2 Doping activation and ohmic contact formation in a SiC electronic device, and SiC electronic device STMICROELECTRONICS S.R.L. (IT) 2023-06-06 US disclosed
US-20210328022-A1 OHMIC CONTACT FORMATION IN A SIC-BASED ELECTRONIC DEVICE STMICROELECTRONICS S.R.L. (IT) 2021-10-21 US disclosed
CN-110468307-A Increase the method for Titanium In Aluminum Alloy GM GLOBAL TECH OPERATIONS LLC 2019-11-19 CN disclosed
US-20190345588-A1 METHODS TO INCREASE TITANIUM IN ALUMINUM ALLOYS GM Global Technology Operations LLC (US) 2019-11-14 US disclosed
CN-109321788-A A kind of acieral, the big alloy of aluminium base and preparation method thereof 王晓军 2019-02-12 CN disclosed
CN-103725935-B A kind of aluminium Si-Cu rare earth alloy material for permanent mold casting and its preparation method and application PINGYIN YUESHEN STRONG DIE-CASTING CO., LTD. (CN) 2016-01-20 CN disclosed
US-8450722-B2 Magnetoresistive random access memory and method of making the same TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2013-05-28 US disclosed
US-20130015538-A1 MAGNETORESISTIVE RANDOM ACCESS MEMORY AND METHOD OF MAKING THE SAME TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2013-01-17 US disclosed
CN-1398426-A Method for improving liquid deposition by selection of liquid viscosity and other precursor characteristics SYMETRIX CORP (US) 2003-02-19 CN disclosed
US-4999160-A Stress resistance, noncracking, nondiffusing MICRON TECHNOLOGY, INC. (US) 1991-03-12 US disclosed