SCHEMBL9908337

SCHEMBL9908337

CC(CC1CCCCC1)(C(F)(F)F)C(F)(F)F

nearest known ligand 0.39

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
CYP1A2 P05177 1/20 0.39
SIGMAR1 Q99720 3/20 0.33
PDK1 Q15118 1/20 0.33
PDK2 Q15119 1/20 0.33
PDK3 Q15120 1/20 0.33
PDK4 Q16654 1/20 0.33
THRA P10827 1/20 0.31
THRB P10828 1/20 0.31
ACHE P22303 1/20 0.30
CHRM5 P08912 2/20 0.30
GRM2 Q14416 1/20 0.30
GRM3 Q14832 1/20 0.30
ADRA2C P18825 1/20 0.30
CHRM2 P08172 1/20 0.30
CHRM4 P08173 1/20 0.30
CHRM1 P11229 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9908342 0.98 CYP1A2 (0.36) CYP1A2SIGMAR1PDK1PDK2PDK3
SCHEMBL9908336 0.93 THRA (0.31) CYP1A2THRATHRB
SCHEMBL17070164 0.81 CYP1A2 (0.39) CYP1A2SIGMAR1PDK1PDK2PDK3
SCHEMBL16825252 0.80 CYP1A2 (0.37) CYP1A2SIGMAR1CHRM5GRM2GRM3
SCHEMBL13464765 0.80 CYP1A2 (0.42) CYP1A2SIGMAR1PDK1PDK2PDK3
SCHEMBL17070180 0.78 CYP1A2 (0.36) CYP1A2SIGMAR1PDK1PDK2PDK3
SCHEMBL91141 0.77 PDK1 (0.39) CYP1A2SIGMAR1PDK1PDK2PDK3
SCHEMBL692846 0.77 CYP1A2 (0.33) CYP1A2SIGMAR1
SCHEMBL1524628 0.76 CYP1A2 (0.48) CYP1A2SIGMAR1THRATHRBACHE
SCHEMBL75027 0.76 CYP1A2 (0.34) CYP1A2SIGMAR1PDK1PDK2PDK3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8753802-B2 Pattern forming method, chemical amplification resist composition and resist film FUJIFILM CORPORATION (JP) 2014-06-17 US disclosed
US-20130045365-A1 PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2013-02-21 US disclosed
US-8198016-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-12 US disclosed
US-20090286188-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-19 US disclosed
US-7189493-B2 Polymer, positive resist composition, and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-03-13 US disclosed