SCHEMBL9908407

SCHEMBL9908407

OCC(O)CCC1CC2CCC1C2

nearest known ligand 0.39

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.35
NPC1 O15118 1/20 0.35
RAB9A P51151 1/20 0.35
KMT2A Q03164 1/20 0.35
OPRK1 P41145 6/20 0.34
THRB P10828 1/20 0.33
PER2 O15055 1/20 0.31
CRY1 Q16526 1/20 0.31
CRY2 Q49AN0 1/20 0.31
HSD11B1 P28845 2/20 0.31
POLB P06746 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7647876 0.81 MEN1 (0.37) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL113192 0.79 OPRK1 (0.40) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL3316247 0.76 MEN1 (0.41) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL19746512 0.76 MEN1 (0.41) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL25233759 0.75 MEN1 (0.41) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL26935787 0.73 OPRK1 (0.36) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL9908423 0.72 MEN1 (0.39) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL9908396 0.71 MEN1 (0.38) MEN1NPC1RAB9AKMT2AOPRK1
SCHEMBL19604523 0.71
SCHEMBL3332075 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9448482-B2 Pattern forming method, resist pattern formed by the method, method for manufacturing electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2016-09-20 US disclosed
US-20150253673-A1 PATTERN FORMING METHOD, RESIST PATTERN FORMED BY THE METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-09-10 US disclosed
US-8198016-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-12 US disclosed
US-20090286188-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-19 US disclosed