SCHEMBL9908409

SCHEMBL9908409

O=C1OCC(CC2CC3CCC2C3)O1

nearest known ligand 0.34

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
HPGD P15428 2/20 0.34
MEN1 O00255 2/20 0.32
KMT2A Q03164 2/20 0.32
NPC1 O15118 1/20 0.32
RAB9A P51151 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9908404 0.86 HPGD (0.33) HPGDMEN1KMT2ANPC1RAB9A
SCHEMBL13374665 0.75 MEN1 (0.35) HPGDMEN1KMT2ANPC1RAB9A
SCHEMBL12564812 0.74 TP53 (0.32)
SCHEMBL15147149 0.71 CHRM5 (0.34) HPGDMEN1KMT2ANPC1RAB9A
SCHEMBL9908408 0.69 MEN1 (0.33) HPGDMEN1KMT2ANPC1RAB9A
SCHEMBL17321573 0.68 HPGD (0.33) HPGD
SCHEMBL6721746 0.68 MEN1 (0.32) HPGDMEN1KMT2ANPC1RAB9A
SCHEMBL48073 0.67
SCHEMBL15906474 0.67
SCHEMBL10418955 0.64

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9448482-B2 Pattern forming method, resist pattern formed by the method, method for manufacturing electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2016-09-20 US disclosed
US-20150253673-A1 PATTERN FORMING METHOD, RESIST PATTERN FORMED BY THE METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-09-10 US disclosed
US-8198016-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-12 US disclosed
US-20090286188-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-19 US disclosed