SCHEMBL13374665

SCHEMBL13374665

C1CC2CC1CC2CC1CO1

nearest known ligand 0.35

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 2/20 0.35
KMT2A Q03164 2/20 0.35
NPC1 O15118 1/20 0.35
RAB9A P51151 1/20 0.35
HPGD P15428 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14528550 0.78 ALDH1A1 (0.36) MEN1KMT2ANPC1RAB9A
SCHEMBL14355134 0.76 TSHR (0.45) MEN1KMT2ANPC1RAB9A
SCHEMBL9908409 0.75 HPGD (0.34) MEN1KMT2ANPC1RAB9AHPGD
SCHEMBL2988153 0.75 MEN1 (0.38) MEN1KMT2ANPC1RAB9AHPGD
SCHEMBL2991139 0.73 MEN1 (0.37) MEN1KMT2ANPC1RAB9A
SCHEMBL9908421 0.72 MEN1 (0.32) MEN1KMT2ANPC1RAB9A
SCHEMBL25233759 0.71 MEN1 (0.41) MEN1KMT2ANPC1RAB9AHPGD
SCHEMBL3001215 0.70 MEN1 (0.35) MEN1KMT2ANPC1RAB9A
SCHEMBL2996232 0.68 MEN1 (0.34) MEN1KMT2ANPC1RAB9A
SCHEMBL2998400 0.68 MEN1 (0.38) MEN1KMT2ANPC1RAB9A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117946148-A IVB metal complex, preparation method and application thereof 万华化学集团股份有限公司 2024-04-30 CN disclosed
CN-104788926-B Polyalkylene carbonate resin composition SK新技术株式会社 2020-07-24 CN disclosed
US-20160009946-A1 UNDER LAYER FILM-FORMING COMPOSITION FOR IMPRINTS AND METHOD FOR FORMING PATTERN FUJIFILM CORPORATION (JP) 2016-01-14 US disclosed
US-8288072-B2 Antireflection film; fast etching speed whcih reduces deformation; accuracy; 2,3-epoxypropyl methacrylate ester-styrene copolymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-10-16 US disclosed
US-7687228-B2 Antireflection film composition and patterning process using the same SHIN ETSU CHEMICAL CO., LTD. (JP) 2010-03-30 US disclosed
US-20080227037-A1 Resist lower layer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-18 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed