SCHEMBL10147065

SCHEMBL10147065

CCC(C)(C)C(=O)CC(C)(C)C1CCC(C)CC1

nearest known ligand 0.31

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
LIPA P38571 1/20 0.31
RIPK1 Q13546 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12996988 0.83 SMN1; SMN2 (0.41) RIPK1
SCHEMBL5309982 0.79 HMGCR (0.39) LIPA
SCHEMBL13141909 0.76 RIPK1 (0.31) RIPK1
SCHEMBL9959957 0.75 KDM4E (0.36)
SCHEMBL107703 0.71 HMGCR (0.33)
SCHEMBL18802856 0.70 HMGCR (0.32)
SCHEMBL19059482 0.70 TDP1 (0.39) LIPA
SCHEMBL15203371 0.69
SCHEMBL15360815 0.69 CES2 (0.31)
SCHEMBL3516359 0.69 HMGCR (0.46) LIPA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8507172-B2 Positive resist composition and pattern forming method using the positive resist composition FUJIFILM CORPORATION (JP) 2013-08-13 US disclosed
US-20120077131-A1 METHOD OF FORMING PATTERN USING ACTINIC-RAY OR RADIATION-SENSITIVE RESIN COMPOSITION, AND PATTERN FUJIFILM CORPORATION (JP) 2012-03-29 US disclosed
US-20100040975-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE POSITIVE RESIST COMPOSITION FUJIFILM CORPORATION (JP) 2010-02-18 US disclosed