SCHEMBL10224664

SCHEMBL10224664

CCC(C)C(=O)OC12CC3CC(CC(OCC(O)CO)(C3)C1)C2

nearest known ligand 0.33

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 1/20 0.31
CYP19A1 P11511 1/20 0.31
PRKCA P17252 1/20 0.31
KDM4E B2RXH2 1/20 0.30
DUSP3 P51452 1/20 0.30
MEN1 O00255 1/20 0.30
KMT2A Q03164 1/20 0.30
LMNA P02545 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10224665 0.84 DPP8 (0.33) CYP17A1CYP19A1MEN1KMT2A
SCHEMBL19842052 0.82
SCHEMBL15043153 0.82 CYP17A1 (0.33) CYP17A1CYP19A1KMT2A
SCHEMBL10259463 0.81 EPHX2 (0.34) CYP17A1CYP19A1KMT2ALMNA
SCHEMBL17773368 0.81 ALDH1A1 (0.34) CYP17A1CYP19A1KMT2A
SCHEMBL16724514 0.81 PRKCA (0.35) CYP17A1CYP19A1PRKCAKMT2A
SCHEMBL15268375 0.80 CYP17A1 (0.35) CYP17A1CYP19A1KMT2A
SCHEMBL10224667 0.80 DPP8 (0.33) CYP17A1CYP19A1
SCHEMBL17853812 0.79 CYP17A1 (0.34) CYP17A1CYP19A1KMT2A
SCHEMBL14226581 0.79 CYP17A1 (0.32) CYP17A1CYP19A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9885956-B2 Pattern forming method, and, electronic device producing method and electronic device, each using the same FUJIFILM CORPORATION (JP) 2018-02-06 US disclosed
US-20150140482-A1 PATTERN FORMING METHOD, AND, ELECTRONIC DEVICE PRODUCING METHOD AND ELECTRONIC DEVICE, EACH USING THE SAME FUJIFILM CORPORATION (JP) 2015-05-21 US disclosed
US-8771921-B2 Negative resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2014-07-08 US disclosed
US-8404426-B2 Negative resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2013-03-26 US disclosed
US-20120164581-A1 NEGATIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND SHO ABE (JP) 2012-06-28 US disclosed
US-7820360-B2 Polymer compound, negative resist composition, and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2010-10-26 US disclosed
US-20100035178-A1 Negative resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. 2010-02-11 US disclosed
US-20090162785-A1 POLYMER COMPOUND, NEGATIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-06-25 US disclosed