SCHEMBL10243718

SCHEMBL10243718

CCC(C)(C(=O)OC(C)(C)C1CCCCC1)C(F)(F)F

nearest known ligand 0.34

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
PDK1 Q15118 1/20 0.34
PDK2 Q15119 1/20 0.34
PDK3 Q15120 1/20 0.34
PDK4 Q16654 1/20 0.34
CHRM2 P08172 4/20 0.32
CHRM4 P08173 4/20 0.32
CHRM1 P11229 4/20 0.32
CHRM3 P20309 4/20 0.32
HSD11B1 P28845 1/20 0.31
ALDH1A1 P00352 1/20 0.30
MAPT P10636 1/20 0.30
LIPA P38571 1/20 0.30
EPHX1 P07099 1/20 0.30
GAA P10253 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13918181 0.88 LIPA (0.43) HSD11B1MAPTLIPAEPHX1
SCHEMBL18802888 0.86 PDK1 (0.33) PDK1PDK2PDK3PDK4CHRM2
SCHEMBL10115724 0.86 PDK1 (0.33) PDK1PDK2PDK3PDK4CHRM2
SCHEMBL12009267 0.86 LIPA (0.33) LIPA
SCHEMBL14598127 0.86 LIPA (0.33) LIPA
SCHEMBL13385934 0.86 PDK1 (0.33) PDK1PDK2PDK3PDK4CHRM2
SCHEMBL15858412 0.83 CHRM2 (0.35) PDK1PDK2PDK3PDK4CHRM2
SCHEMBL18802879 0.80 FKBP1A (0.36) CHRM2CHRM4CHRM1CHRM3EPHX1
SCHEMBL18802861 0.80 FKBP1A (0.36) CHRM2CHRM4CHRM1CHRM3EPHX1
SCHEMBL106966 0.80 FKBP1A (0.36) CHRM2CHRM4CHRM1CHRM3EPHX1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8846290-B2 Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2014-09-30 US disclosed
US-20120015302-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-19 US disclosed
US-20070178405-A1 Positive resist composition and method of pattern formation with the same FUJI PHOTO FILM CO., LTD. 2007-08-02 US disclosed