SCHEMBL1060897

SCHEMBL1060897

O=S(=O)(CS(=O)(=O)C1CCCCC1)C1CCCCC1

nearest known ligand 0.37

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
CA1 P00915 3/20 0.36
CA12 O43570 2/20 0.36
CA7 P43166 2/20 0.36
CA14 Q9ULX7 2/20 0.36
LOXL2 Q9Y4K0 3/20 0.33
CA2 P00918 2/20 0.33
EPHX1 P07099 2/20 0.33
TP53 P04637 1/20 0.33
LOX P28300 1/20 0.33
KDM4E B2RXH2 1/20 0.32
GMNN O75496 1/20 0.32
LMNA P02545 1/20 0.32
MAPT P10636 1/20 0.32
BLM P54132 1/20 0.32
PMP22 Q01453 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.32
CA9 Q16790 1/20 0.32
SHBG P04278 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21396988 0.85 CA12 (0.31) CA1CA12CA7CA14LOXL2
SCHEMBL4814240 0.83 MMP1 (0.32) CA1CA12CA7CA14SHBG
SCHEMBL2951024 0.81 CA1 (0.32) CA1CA12CA7CA14LOXL2
SCHEMBL7894665 0.81 CA2 (0.33) CA2
SCHEMBL778401 0.80 MMP1 (0.35) CA1CA12CA7CA14LOXL2
SCHEMBL5662340 0.78 CA1 (0.33) CA1CA12CA7CA14LOXL2
SCHEMBL777574 0.78 CA1 (0.33) CA1CA12CA7CA14LOXL2
SCHEMBL14454083 0.78 CA1 (0.33) CA1CA12CA7CA14LOXL2
SCHEMBL776888 0.77 MMP1 (0.33) CA1CA12CA7CA14EPHX1
SCHEMBL10654218 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 82 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6479210-B2 COMPRISING AN ORGANIC MATERIAL CONTAINING SUBSTITUENT(S) CAPABLE OF BEING RELEASED IN THE PRESENCE OF ACID, AND ACID GENERATORS OF AT LEAST ONE ONIUM SALT AND SULFONE AND/OR SULFONATE COMPOUNDS; RESOLUTION, SENSITIVITY CLARIANT FINANCE (BVI) LIMITED (VG) 2002-11-12 US claimed
US-20250352110-A1 BIO-ELECTRODE COMPOSITION, BIO-ELECTRODE, AND METHOD FOR PRODUCING BIO-ELECTRODE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-11-20 US disclosed
EP-4651157-A1 BIO-ELECTRODE COMPOSITION, BIO-ELECTRODE, AND METHOD FOR PRODUCING BIO-ELECTRODE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-11-19 EP disclosed
US-20240206322-A1 OPTICAL SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SAME, SOLID-STATE IMAGING DEVICE, AND ELECTRONIC DEVICE KANEKA CORPORATION (JP) 2024-06-20 US disclosed
US-20230408923-A1 SUBSTRATE LAMINATE, IMAGE SENSOR, AND METHOD FOR MANUFACTURING SUBSTRATE LAMINATE KANEKA CORPORATION (JP) 2023-12-21 US disclosed
CN-117121184-A Optical semiconductor device, method for manufacturing the same, solid-state imaging device, and electronic apparatus 株式会社钟化 2023-11-24 CN disclosed
CN-117083706-A Substrate laminate, image sensor, and method for manufacturing substrate laminate 株式会社钟化 2023-11-17 CN disclosed
CN-110963952-B Onium salt, resist composition and pattern forming method 信越化学工业株式会社 2022-10-21 CN disclosed
CN-115185156-A Photosensitive resin composition for forming partition wall, organic electroluminescent element, image display device, and illumination 三菱化学株式会社 2022-10-14 CN disclosed
CN-109661855-B Photosensitive resin composition for forming organic electroluminescent element spacer, organic electroluminescent element, image display device, and lighting 三菱化学株式会社 2022-07-08 CN disclosed
US-5468589-A Heat resistant, photosensitive patterns WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1995-11-21 US disclosed
EP-0675410-A1 Resist composition for deep ultraviolet light WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1995-10-04 EP disclosed
US-5389491-A Negative working resist composition MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 1995-02-14 US disclosed
US-5350660-A Chemical amplified resist material containing photosensitive compound capable of generating an acid and specific polystyrene copolymer having functional groups that become alkali-soluble under an acid atmosphere WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1994-09-27 US disclosed
EP-0440375-B1 Diazodisulfones WAKO PURE CHEM IND LTD (JP) 1994-07-13 EP disclosed
EP-0579420-A2 Negative working resist material and pattern forming process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1994-01-19 EP disclosed
US-5216135-A Photosensitive material which generates an acid by irradiation ; high transmittance, solution stability in photoresists and dissolution inhibiting of photoresists in alkali developers WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1993-06-01 US disclosed
EP-0520642-A1 Resist material and pattern formation process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1992-12-30 EP disclosed
EP-0440374-A2 Chemical amplified resist material WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1991-08-07 EP disclosed
EP-0440375-A1 Diazodisulfones WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1991-08-07 EP disclosed