SCHEMBL106516

SCHEMBL106516

CC(C)O[Si](OC(C)C)(c1ccccc1)c1ccccc1

nearest known ligand 0.36

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.36
ALDH1A1 P00352 2/20 0.35
L3MBTL1 Q9Y468 1/20 0.35
ESR1 P03372 1/20 0.33
ESR2 Q92731 1/20 0.33
NPSR1 Q6W5P4 1/20 0.32
TDP1 Q9NUW8 1/20 0.32
PDCD1 Q15116 1/20 0.31
CD274 Q9NZQ7 1/20 0.31
TAAR1 Q96RJ0 1/20 0.31
LMNA P02545 1/20 0.31
MAOA P21397 1/20 0.31
MAOB P27338 1/20 0.31
MAPT P10636 1/20 0.31
CA4 P22748 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL705119 0.98 ESR1 (0.37) TSHRALDH1A1L3MBTL1ESR1ESR2
SCHEMBL28390987 0.89 TSHR (0.33) TSHRALDH1A1L3MBTL1ESR1ESR2
SCHEMBL27743568 0.88 ESR1 (0.53) TSHRALDH1A1ESR1ESR2TDP1
SCHEMBL24442805 0.83 NPSR1 (0.31) TSHRNPSR1
SCHEMBL6338270 0.83 HTT (0.33) TSHRALDH1A1LMNA
SCHEMBL9633947 0.81 TSHR (0.34) TSHRALDH1A1L3MBTL1ESR1ESR2
SCHEMBL62236 0.80 SLC6A2 (0.31) TAAR1
SCHEMBL62234 0.80 TDP1 (0.33) ALDH1A1TDP1
SCHEMBL705272 0.80 ESR1 (0.38) TSHRALDH1A1L3MBTL1ESR1ESR2
SCHEMBL106923 0.80 TDP1 (0.37) TSHRALDH1A1L3MBTL1ESR1ESR2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 650 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120040771-A Hafnium hybridization carbon-rich polysiloxane flexible ablation material, preparation method and application thereof 四川大学 2025-05-27 CN claimed
CN-109952351-B Antifouling coating composition and coated article having antifouling coating film formed on surface thereof 日东化成株式会社 2021-07-30 CN claimed
EP-2628744-B1 Silicon-containing surface modifier, resist underlayer film composition containing this, and patterning process SHINETSU CHEMICAL CO (JP) 2016-11-30 EP claimed
EP-2628745-B1 Silicon-containing surface modifier, resist lower layer film-forming composition containing the same, and patterning process SHINETSU CHEMICAL CO (JP) 2015-03-25 EP claimed
US-8216649-B2 Liquid crystal aligning agent, method of producing a liquid crystal alignment film and liquid crystal display device JSR CORPORATION (JP) 2012-07-10 US claimed
US-20260118767-A1 REVERSE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-30 US disclosed
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-12 US disclosed
EP-4692941-A2 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2026-02-11 EP disclosed
US-20260035591-A1 EPOXY RESIN COMPOSITION SHINETSU CHEMICAL CO (JP) 2026-02-05 US disclosed
EP-4686727-A1 EPOXY RESIN COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-04 EP disclosed
EP-4660703-A2 METAL-CONTAINING FILM PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2025-12-10 EP disclosed
US-20250372377-A1 METAL-CONTAINING FILM PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-12-04 US disclosed
US-5661219-A AN ACRYLIC COPOLYMER HAVING CARBOXY GROUPS BLOCKED BY A VINYL ETHER, A REACTIVE POLYMER, E.G.HAVING EPOXY GROUPS, AND LEWIS ACID-COMPLEX CATALYST; HIGH SOLIDS; LOW TEMPERATURE CURING; STORAGE STABILITY; MECHANICAL PROPERTIES NOF CORPORATION (JP) 1997-08-26 US disclosed
EP-0643112-B1 Curable composition, thermal latent acid catalyst, method of coating, coated article, method of molding and molded article NOF CORP (JP) 1997-07-30 EP disclosed
EP-0709415-A2 Curable base-coat composition, method of film-forming and coated articles NOF CORPORATION (JP) 1996-05-01 EP disclosed
EP-0643112-A2 Curable composition, thermal latent acid catalyst, method of coating, coated article, method of molding and molded article NOF CORPORATION (JP) 1995-03-15 EP disclosed
EP-0226208-B1 INSULATING FILM FOR SEMICONDUCTOR, PRODUCTION OF THE SAME AND LIQUID COMPOSITION FOR PRODUCING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1991-11-21 EP disclosed
US-4865949-A Optical information recording medium RICOH COMPANY, LTD. (JP) 1989-09-12 US disclosed
EP-0226208-A2 Insulating film for semiconductor, production of the same and liquid composition for producing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1987-06-24 EP disclosed
US-4387196-A DIELECTRICS RAYCHEM LIMITED (GB) 1983-06-07 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260035591-A1 EPOXY RESIN COMPOSITION ASH2L, PSMA1, SEM1 TSHR 3424/4885ALDH1A1 641/4885L3MBTL1 1067/4885
US-20260118767-A1 REVERSE PATTERNING PROCESS EFNA1, EPHA4, ETV6 TSHR 770/4885ALDH1A1 4452/4885L3MBTL1 1596/4885
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SMC1A, SPOUT1, LBR TSHR 446/4885ALDH1A1 1558/4885L3MBTL1 282/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.