SCHEMBL107418

SCHEMBL107418

CO[Si](CCCC1=CC=CC1)(OC)OC

nearest known ligand 0.30

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL215958 0.84
SCHEMBL9617045 0.82
SCHEMBL108926 0.82
SCHEMBL9233158 0.81 ALDH1A1 (0.32)
SCHEMBL109116 0.81
SCHEMBL106355 0.80
SCHEMBL10714995 0.78 CHRM1 (0.30)
SCHEMBL8726334 0.77
SCHEMBL215740 0.76
SCHEMBL10709281 0.76

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 219 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2628744-B1 Silicon-containing surface modifier, resist underlayer film composition containing this, and patterning process SHINETSU CHEMICAL CO (JP) 2016-11-30 EP claimed
EP-2628745-B1 Silicon-containing surface modifier, resist lower layer film-forming composition containing the same, and patterning process SHINETSU CHEMICAL CO (JP) 2015-03-25 EP claimed
CN-101917826-B Method for increasing binding force between electric conductor and non-conductive polymer dielectric layer in printed circuit board substrate DONGGUAN RENJI ELECTRONIC MATERIALS CO LTD 2013-08-21 CN claimed
CN-101917826-A Method for increasing binding force between electric conductor and non-conductive polymer dielectric layer in printed circuit board substrate DONGGUAN RENJI ELECTRONIC MATERIALS CO LTD 2010-12-15 CN claimed
US-6805964-B2 CONTACTING AT LEAST ONE SIDE OF THE METAL FOIL WITH AN INERT SILANE, TITANATE OR ZIRCONATE COMPOUND TO FORM A PROTECTIVE FILM HAVING THICKNESS 0.001 TO 1 MICRON ON THE SURFACE OF THE METAL FOIL NIKKO MATERIALS USA, INC. 2004-10-19 US claimed
US-20030178139-A1 Protective coatings for improved tarnish resistance in metal foils NIKKO MATERIALS USA, INC. 2003-09-25 US claimed
US-6589381-B2 Contacting copper foil with an inert silane, titanate or zirconate compound to form a resin dust resistant film, laminating metal foil to a resin selected from polyimde, polyester or epoxy resin GOULD ELECTRONICS, INC. 2003-07-08 US claimed
US-6537675-B1 Protective film of at least one inert silane, titanate or zirconate overlying the first side of the metal foil; and a metal sheet having a first side and a second side, the first side overlying the protective film GA-TEK, INC. 2003-03-25 US claimed
US-6299721-B1 CONTACTING FIRST SIDE OF METAL FOIL WITH SOLUTION COMPRISING HYDROCARBYLSILANE, WATER, ORGANIC SOLVENT AND TRIAZOLE COMPOUND TO FORM RESIN DUST RESISTANT FILM ON SURFACE OF METAL GOULD ELECTRONICS INCL 2001-10-09 US claimed
US-20010015257-A1 Coatings for improved resin dust resistance NIKKO MATERIALS USA, INC. 2001-08-23 US claimed
EP-1011299-A2 Coatings for improved resin dust resistance GA-TEK Inc. (US) 2000-06-21 EP claimed
US-20260118767-A1 REVERSE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-30 US disclosed
EP-4700067-A1 COMPOSITION FOR FORMING SILICON-CONTAINING FILM, METHOD FOR FORMING FILM, AND SUPERSTRATE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-25 EP disclosed
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-12 US disclosed
EP-4692941-A2 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2026-02-11 EP disclosed
EP-1011299-A2 Coatings for improved resin dust resistance GA-TEK Inc. (US) 2000-06-21 EP disclosed
WO-1998009913-A1 REVERSIBLE COVALENT ATTACHMENT OF FULLERENES TO INSOLUBLE SUPPORTS UNIVERSITY OF MASSACHUSETTS (US) 1998-03-12 WO disclosed
US-4704428-A ANCHORING AGENT FOR SILICATE FILER DEGUSSA AKTIENGESELLSCHAFT (DE) 1987-11-03 US disclosed
US-4645850-A CROSSLINKING DEGUSSA AKTIENGESELLSCHAFT (DE) 1987-02-24 US disclosed
EP-0170011-A2 Silyl-substituted cyclopentadienes, process for their preparation and mixtures of synthetic material and rubber containing these Degussa Aktiengesellschaft (DE) 1986-02-05 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260118767-A1 REVERSE PATTERNING PROCESS EFNA1, EPHA4, ETV6 LMNA 755/4885
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SMC1A, SPOUT1, LBR LMNA 2488/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.