SCHEMBL1142001

SCHEMBL1142001

C=C(C)C(=O)OC1C2CC3C1OC(=O)C3C2C(=O)OC(C)(C)C

nearest known ligand 0.33

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 1/20 0.33
NPC1 O15118 1/20 0.33
POLB P06746 1/20 0.33
MAPT P10636 1/20 0.33
PKM P14618 1/20 0.33
HTT P42858 1/20 0.33
RECQL P46063 1/20 0.33
RAB9A P51151 1/20 0.33
ATM Q13315 1/20 0.33
TDP1 Q9NUW8 1/20 0.33
GPX4 P36969 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13482543 0.90
SCHEMBL13461814 0.89 KDM4E (0.32) KDM4ENPC1POLBMAPTPKM
SCHEMBL963867 0.89
SCHEMBL24361094 0.88
SCHEMBL92274 0.88 HTT (0.33) KDM4ENPC1POLBMAPTPKM
SCHEMBL22200986 0.88 HTT (0.33) KDM4ENPC1POLBMAPTPKM
SCHEMBL19719133 0.88 HTT (0.33) KDM4ENPC1POLBMAPTPKM
SCHEMBL23077918 0.88 HTT (0.33) KDM4ENPC1POLBMAPTPKM
SCHEMBL13461819 0.88 KDM4E (0.32) KDM4ENPC1POLBMAPTPKM
SCHEMBL13482537 0.88

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 40 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2023095563-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD JSR株式会社 2023-06-01 WO disclosed
US-9862695-B2 Monomer having N-acyl carbamoyl group and lactone skeleton, and polymeric compound DAICEL CORPORATION (JP) 2018-01-09 US disclosed
US-20160060374-A1 MONOMER HAVING N-ACYL CARBAMOYL GROUP AND LACTONE SKELETON, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2016-03-03 US disclosed
EP-2533101-B1 Sulfonium salt, polymer, chemically amplified resist composition containing said polymer, and resist patterning process SHINETSU CHEMICAL CO (JP) 2014-11-19 EP disclosed
EP-2533101-B1 Sulfonium salt, polymer, chemically amplified resist composition containing said polymer, and resist patterning process SHINETSU CHEMICAL CO (JP) 2014-11-19 EP disclosed
US-8835097-B2 Sulfonium salt, polymer, chemically amplified resist composition using said polymer, and resist patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-16 US disclosed
US-8835097-B2 Sulfonium salt, polymer, chemically amplified resist composition using said polymer, and resist patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-16 US disclosed
US-8835097-B2 Sulfonium salt, polymer, chemically amplified resist composition using said polymer, and resist patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-16 US disclosed
US-8753793-B2 Method for producing resin solution for photoresist, photoresist composition, and pattern-forming method DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2014-06-17 US disclosed
US-8530134-B2 Process for producing photoresist polymeric compounds DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2013-09-10 US disclosed
US-20090274984-A1 CARBOXYL-CONTAINING LACTONE COMPOUND, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-05 US disclosed
US-7491483-B2 Polymers, positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-02-17 US disclosed
US-20080319160-A1 Polycyclic Ester Containing Cyano Group and Lactone Skeleton DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2008-12-25 US disclosed
EP-1930328-A1 CYANO-CONTAINING POLYCYCLIC ESTERS HAVING LACTONE SKELETONS DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2008-06-11 EP disclosed
US-20070264592-A1 Resist polymer, preparing method, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-11-15 US disclosed
US-20070264592-A1 Resist polymer, preparing method, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-11-15 US disclosed
US-20070207408-A1 Polymers, positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2007-09-06 US disclosed
US-20070207408-A1 Polymers, positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2007-09-06 US disclosed
US-20060160247-A1 Unsaturated carboxylic acid hemicacetal ester, polymeric compound and photoresist resin composition DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2006-07-20 US disclosed
US-20050238990-A1 Photoresist resin and photoresist resin composition DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2005-10-27 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20060160247-A1 Unsaturated carboxylic acid hemicacetal ester, polymeric compound and photoresist resin composition HCAR1, HCAR2, RARA KDM4E 3157/4885NPC1 4727/4885POLB 3935/4885
US-20090274984-A1 CARBOXYL-CONTAINING LACTONE COMPOUND, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS WDR1, EGLN1, RER1 KDM4E 115/4885NPC1 4443/4885POLB 3067/4885
US-20160060374-A1 MONOMER HAVING N-ACYL CARBAMOYL GROUP AND LACTONE SKELETON, AND POLYMERIC COMPOUND CNKSR1, NMRAL1, CCNA1 KDM4E 3086/4885NPC1 2833/4885POLB 3941/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.