SCHEMBL116867

SCHEMBL116867

CCC(C)(C)C(=O)OCC(O)CO

nearest known ligand 0.46

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
LMNA P02545 2/20 0.46
KDM4E B2RXH2 1/20 0.46
DUSP3 P51452 1/20 0.46
MEN1 O00255 1/20 0.46
KMT2A Q03164 1/20 0.46
PRKCA P17252 1/20 0.42
DGKA P23743 1/20 0.40
FAAH O00519 2/20 0.38
HMGCR P04035 2/20 0.37
CYP4F2 P78329 1/20 0.37
CYP4A11 Q02928 1/20 0.37
AR P10275 2/20 0.35
VDR P11473 2/20 0.35
USP2 O75604 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13829166 0.91 HMGCR (0.40) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL12135548 0.90 HMGCR (0.40) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL26326082 0.87 LMNA (0.36) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL8986670 0.86 HMGCR (0.41) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL11306638 0.86 KDM4E (0.43) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL26326087 0.86 PRKCA (0.38) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL19428724 0.85 HMGCR (0.37) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL13829320 0.84 USP2 (0.45) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL14354901 0.83 LMNA (0.40) LMNAKDM4EDUSP3MEN1KMT2A
SCHEMBL10017776 0.83 HMGCR (0.36) LMNAKDM4EDUSP3MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 142 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12044968-B2 Protective film-forming composition having acetal structure and amide structure NISSAN CHEMICAL CORPORATION (JP) 2024-07-23 US disclosed
US-20240231231-A1 METHOD FOR FORMING RESIST UNDERLAYER FILM, METHOD FOR PRODUCING SEMICONDUCTOR SUBSTRATE, COMPOSITION, AND RESIST UNDERLAYER FILM JSR CORPORATION (JP) 2024-07-11 US disclosed
US-20230400767-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMER, AND COMPOUND JSR CORPORATION (JP) 2023-12-14 US disclosed
US-11839700-B2 Bio-electrode composition, bio-electrode, and method for manufacturing a bio-electrode SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-12-12 US disclosed
US-11841521-B2 Optical film, circularly polarizing plate, and organic electroluminescence display device FUJIFILM CORPORATION (JP) 2023-12-12 US disclosed
US-11820162-B2 Pretreatment liquid, ink set, base material for image recording, method of producing base material for image recording, image recording material, and image recording method FUJIFILM CORPORATION (JP) 2023-11-21 US disclosed
US-20230369600-A1 ELECTRODE COMPOSITION, ELECTRODE SHEET FOR ALL-SOLID STATE SECONDARY BATTERY, AND ALL-SOLID STATE SECONDARY BATTERY, AND MANUFACTURING METHODS FOR ELECTRODE SHEET FOR ALL-SOLID STATE SECONDARY BATTERY AND ALL-SOLID STATE SECONDARY BATTERY FUJIFILM CORPORATION (JP) 2023-11-16 US disclosed
US-11773266-B2 Polymer, molded body, foam, resin composition, and production method for polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-10-03 US disclosed
US-11768436-B2 Protective film forming composition having a diol structure NISSAN CHEMICAL CORPORATION (JP) 2023-09-26 US disclosed
US-20230276683-A1 ORGANIC ELECTROLUMINESCENT DISPLAY DEVICE FUJIFILM CORPORATION (JP) 2023-08-31 US disclosed
US-20090047601-A1 PLANOGRAPHIC PRINTING PLATE PRECURSOR AND PRINTING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2009-02-19 US disclosed
US-20090029151-A1 TRANSPARENT CONDUCTIVE FILM AND TOUCH PANEL NITTO DENKO CORPORATION (JP) 2009-01-29 US disclosed
US-20080227037-A1 Resist lower layer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-18 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed
US-7390099-B2 Hard-coated antiglare film and method of manufacturing the same NITTO DENKO CORPORATION (JP) 2008-06-24 US disclosed
US-7390099-B2 Hard-coated antiglare film and method of manufacturing the same NITTO DENKO CORPORATION (JP) 2008-06-24 US disclosed
US-20080090172-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-04-17 US disclosed
US-20080045420-A1 Zwitterionic Polymers Comprising Betaine-Type Units And Use Of Zwitterionic Polymers In Drilling Fluids RHODIA CHIMIE (FR) 2008-02-21 US disclosed
US-20080045420-A1 Zwitterionic Polymers Comprising Betaine-Type Units And Use Of Zwitterionic Polymers In Drilling Fluids RHODIA CHIMIE (FR) 2008-02-21 US disclosed
US-20070212641-A1 Lithographic printing plate precursor and method for preparation of lithographic printing plate FUJIFILM CORPORATION (JP) 2007-09-13 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20230400767-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMER, AND COMPOUND RER1, RAD51, RFT1 LMNA 2894/4885KDM4E 1854/4885DUSP3 4882/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.