SCHEMBL12015341

SCHEMBL12015341

CC(=O)OC1CCCCC(=O)N1C(=O)C(C)(C)C

nearest known ligand 0.35

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
CHRM2 P08172 4/20 0.35
CHRM1 P11229 2/20 0.35
CHRM4 P08173 1/20 0.35
CHRM3 P20309 1/20 0.35
POLB P06746 1/20 0.34
SLC18A3 Q16572 1/20 0.32
CYP2D6 P10635 2/20 0.32
MEN1 O00255 1/20 0.32
KMT2A Q03164 1/20 0.32
ELANE P08246 1/20 0.32
MAPT P10636 1/20 0.31
RIPK1 Q13546 3/20 0.31
NPC1 O15118 1/20 0.30
HTT P42858 1/20 0.30
RAB9A P51151 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12015382 0.95 CHRM2 (0.36) CHRM2CHRM1CHRM4CHRM3POLB
SCHEMBL12015357 0.91 CHRM2 (0.36) CHRM2CHRM1CHRM4CHRM3POLB
SCHEMBL12015354 0.81 POLB (0.38) CHRM2CHRM1CHRM4CHRM3POLB
SCHEMBL12764299 0.79 CHRM2 (0.38) CHRM2CHRM1CHRM4CHRM3POLB
SCHEMBL12764329 0.78 CHRM2 (0.34) CHRM2CHRM1CHRM4CHRM3POLB
SCHEMBL27699894 0.78 CHRM2 (0.39) CHRM2CHRM1CHRM4CHRM3ELANE
SCHEMBL12015368 0.78 CA1 (0.34) KMT2ARIPK1SMN1; SMN2
SCHEMBL12015339 0.76 RIPK1 (0.33) RIPK1SMN1; SMN2
SCHEMBL12015348 0.74 ACE (0.32) MEN1KMT2ARIPK1NPC1RAB9A
SCHEMBL12764308 0.74 CHRM2 (0.39) CHRM2CHRM1CHRM4CHRM3POLB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9405191-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-20160077433-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-17 US disclosed
US-8859182-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2014-10-14 US disclosed
US-8563217-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-10-22 US disclosed
US-20130022910-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-01-24 US disclosed
US-20120219907-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed
US-20120219898-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed