SCHEMBL12015368

SCHEMBL12015368

CC1CCCCC(=O)N1C(=O)C(C)(C)C

nearest known ligand 0.37

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
CA1 P00915 1/20 0.34
CA2 P00918 1/20 0.34
CA4 P22748 1/20 0.34
RIPK1 Q13546 4/20 0.33
AKR1C3 P42330 4/20 0.33
HPGD P15428 2/20 0.33
SMN1; SMN2 Q16637 2/20 0.33
GAA P10253 1/20 0.33
KMT2A Q03164 1/20 0.33
RECQL P46063 1/20 0.33
PER2 O15055 1/20 0.32
MITF O75030 1/20 0.31
GPR174 Q9BXC1 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12015347 0.95 PER2 (0.34) RIPK1AKR1C3HPGDSMN1; SMN2GAA
SCHEMBL12015339 0.81 RIPK1 (0.33) RIPK1SMN1; SMN2MITF
SCHEMBL12015341 0.78 CHRM2 (0.35) RIPK1SMN1; SMN2KMT2A
SCHEMBL12015346 0.76 RIPK1 (0.33) RIPK1KMT2A
SCHEMBL12015340 0.76 RIPK1 (0.38) RIPK1SMN1; SMN2KMT2A
SCHEMBL12764280 0.75 CA1 (0.37) CA1CA2CA4AKR1C3HPGD
SCHEMBL23002163 0.74 ACE (0.35) AKR1C3HPGDSMN1; SMN2GAARECQL
SCHEMBL8378678 0.74 CREBBP (0.39) AKR1C3HPGDGAARECQLPER2
SCHEMBL24366649 0.73 CHRM2 (0.41) HPGD
SCHEMBL15017885 0.73 CHRM2 (0.41) HPGD

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9405191-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-20160077433-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-17 US disclosed
US-8859182-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2014-10-14 US disclosed
US-8563217-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-10-22 US disclosed
US-20130022910-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-01-24 US disclosed
US-20120219898-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed
US-20120219907-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed