SCHEMBL12015339

SCHEMBL12015339

CC(C)(C)C(=O)N1C(=O)CCCCC1F

nearest known ligand 0.33

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
RIPK1 Q13546 5/20 0.33
CNR2 P34972 1/20 0.31
MITF O75030 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
LMNA P02545 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12015346 0.95 RIPK1 (0.33) RIPK1CNR2LMNA
SCHEMBL12015342 0.88 ACE (0.33) RIPK1CNR2
SCHEMBL12015368 0.81 CA1 (0.34) RIPK1MITFSMN1; SMN2
SCHEMBL12015349 0.77 RIPK1 (0.37) RIPK1
SCHEMBL12015341 0.76 CHRM2 (0.35) RIPK1SMN1; SMN2
SCHEMBL12015347 0.76 PER2 (0.34) RIPK1SMN1; SMN2LMNA
SCHEMBL12764282 0.73 GSK3B (0.30)
SCHEMBL12015343 0.72 ACE (0.34) RIPK1
SCHEMBL12015382 0.71 CHRM2 (0.36) RIPK1
SCHEMBL21945623 0.69 ACE (0.53) RIPK1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9405191-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-20160077433-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-17 US disclosed
US-8859182-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2014-10-14 US disclosed
US-8563217-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-10-22 US disclosed
US-20130022910-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-01-24 US disclosed
US-20120219907-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed
US-20120219898-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed