SCHEMBL12733152

SCHEMBL12733152

CCC(C)(C)C(=O)OCc1ccc(-c2ccccc2)cc1

nearest known ligand 0.51

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
RAB9A P51151 2/20 0.48
NPC1 O15118 1/20 0.48
NAAA Q02083 6/20 0.47
MAPT P10636 2/20 0.47
ALDH1A1 P00352 1/20 0.46
MEN1 O00255 2/20 0.45
KMT2A Q03164 2/20 0.45
TP53 P04637 1/20 0.45
HPGD P15428 1/20 0.45
SMN1; SMN2 Q16637 1/20 0.45
EPHX1 P07099 1/20 0.45

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL116845 0.90 ALDH1A1 (0.56) RAB9ANPC1MAPTALDH1A1MEN1
SCHEMBL12445029 0.90 ALDH1A1 (0.42) RAB9ANPC1NAAAMAPTALDH1A1
SCHEMBL12733146 0.83 ALDH1A1 (0.44) RAB9ANPC1NAAAMAPTALDH1A1
SCHEMBL2742136 0.83 MEN1 (0.50) ALDH1A1MEN1KMT2A
SCHEMBL10159813 0.82 PPARG (0.44) RAB9ANPC1ALDH1A1MEN1KMT2A
SCHEMBL12116550 0.82 HPGD (0.46) RAB9ANPC1NAAAMAPTALDH1A1
SCHEMBL27652957 0.82 ALDH1A1 (0.47) ALDH1A1MEN1KMT2ASMN1; SMN2
SCHEMBL13926411 0.82 ENPP2 (0.37) RAB9ANPC1NAAAMAPTALDH1A1
SCHEMBL14178034 0.81 PTPRC (0.53) RAB9AMAPTALDH1A1MEN1KMT2A
SCHEMBL19420321 0.81 ALDH1A1 (0.37) RAB9ANPC1ALDH1A1MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9417528-B2 Pattern forming method, multi-layered resist pattern, multi-layered film for organic solvent development, resist composition, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2016-08-16 US disclosed
US-20150248056-A1 PATTERN FORMING METHOD, MULTI-LAYERED RESIST PATTERN, MULTI-LAYERED FILM FOR ORGANIC SOLVENT DEVELOPMENT, RESIST COMPOSITION, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-09-03 US disclosed
US-9075310-B2 Pattern forming method, multi-layered resist pattern, multi-layered film for organic solvent development, resist composition, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2015-07-07 US disclosed
US-20140234761-A1 PATTERN FORMING METHOD, MULTI-LAYERED RESIST PATTERN, MULTI-LAYERED FILM FOR ORGANIC SOLVENT DEVELOPMENT, RESIST COMPOSITION, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2014-08-21 US disclosed
US-8349535-B2 Actinic ray-sensitive or radiation-sensitive resin composition and method of forming pattern therewith FUJIFILM CORPORATION (JP) 2013-01-08 US disclosed
US-20110081612-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH FUJIFILM CORPORATION (JP) 2011-04-07 US disclosed