SCHEMBL12833002

SCHEMBL12833002

CCC(CC)(C(F)(F)C(C)S(=O)(=O)N1CCCCC1)S(=O)(=O)O

nearest known ligand 0.31

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
EPHX2 P34913 1/20 0.31
HTT P42858 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13713663 0.87 CTSS (0.35) HTT
SCHEMBL16449157 0.86 SMN1; SMN2 (0.34)
SCHEMBL13713620 0.84 HTT (0.32) EPHX2HTT
SCHEMBL12832622 0.84
SCHEMBL14535331 0.74 HTT (0.32) HTT
SCHEMBL12832743 0.73 TP53 (0.32) EPHX2
SCHEMBL9608636 0.73 CA1 (0.39) EPHX2
SCHEMBL12832561 0.73 EPHX2 (0.34) EPHX2
SCHEMBL13713604 0.72 HTT (0.33) HTT
SCHEMBL13451031 0.72 HTT (0.33) HTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7906268-B2 Positive resist composition for immersion exposure and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2011-03-15 US disclosed
US-20070105045-A1 Positive resist composition and pattern formation method using the positive resist composition FUJIFILM CORPORATION 2007-05-10 US disclosed