SCHEMBL13027768

SCHEMBL13027768

CO[Si](Cc1ccc(C)cc1[Si](OC)(OC)OC)(OC)OC

nearest known ligand 0.35

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.34
KDM4E B2RXH2 1/20 0.34
ACHE P22303 1/20 0.31
LMNA P02545 2/20 0.31
MAPT P10636 2/20 0.31
GAA P10253 1/20 0.31
TSHR P16473 1/20 0.31
MAPK1 P28482 1/20 0.31
TDP1 Q9NUW8 1/20 0.31
L3MBTL1 Q9Y468 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13027743 0.86 TAAR1 (0.32) ACHELMNAMAPTGAATSHR
SCHEMBL13027686 0.83 ACHE (0.33) ALDH1A1KDM4EACHELMNAMAPT
SCHEMBL13027742 0.81 APLNR (0.39) ALDH1A1
SCHEMBL730220 0.80 ALDH1A1 (0.35) ALDH1A1KDM4EACHELMNAMAPT
SCHEMBL7165863 0.80 TAAR1 (0.36) ALDH1A1KDM4EACHELMNAMAPT
SCHEMBL13027231 0.79 KDM4E (0.44) ALDH1A1KDM4EACHELMNAMAPT
SCHEMBL13027244 0.76 ACHE (0.50) ALDH1A1KDM4EACHELMNAMAPT
SCHEMBL13027766 0.76
SCHEMBL13027229 0.76 TAAR1 (0.47) ALDH1A1KDM4EACHELMNAMAPT
SCHEMBL13027790 0.74 ACHE (0.39) ALDH1A1ACHETDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8697330-B2 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-04-15 US disclosed
US-20100285407-A1 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-11 US disclosed