SCHEMBL13201522

SCHEMBL13201522

CCC(C)(C)C(=O)OCC(C)CO

nearest known ligand 0.42

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
PRKCA P17252 1/20 0.42
CYP4F2 P78329 2/20 0.37
CYP4A11 Q02928 2/20 0.37
TSHR P16473 1/20 0.32
HMGCR P04035 1/20 0.32
RIPK1 Q13546 1/20 0.32
MMP8 P22894 1/20 0.32
MAPT P10636 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14769605 0.90 PRKCA (0.37) PRKCACYP4F2CYP4A11HMGCRMMP8
SCHEMBL15177808 0.86 PRKCA (0.43) PRKCACYP4F2CYP4A11
SCHEMBL8988305 0.86 MAPT (0.42) PRKCACYP4F2CYP4A11HMGCRMMP8
SCHEMBL18388526 0.83 TSHR (0.35) PRKCACYP4F2CYP4A11TSHRHMGCR
SCHEMBL16521496 0.83 PRKCA (0.33) PRKCACYP4F2CYP4A11HMGCRMMP8
SCHEMBL107644 0.83 EGFR (0.36) PRKCACYP4F2CYP4A11HMGCRMMP8
SCHEMBL13829150 0.82 PRKCA (0.43) PRKCACYP4F2CYP4A11TSHRHMGCR
SCHEMBL2681020 0.82 TSHR (0.42) PRKCACYP4F2CYP4A11TSHRHMGCR
SCHEMBL116867 0.81 LMNA (0.46) PRKCACYP4F2CYP4A11HMGCR
SCHEMBL12026658 0.80 GAA (0.33) PRKCACYP4F2CYP4A11HMGCR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11773266-B2 Polymer, molded body, foam, resin composition, and production method for polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-10-03 US disclosed
US-20230129965-A1 HYDROPHILIC AND OLEOPHOBIC POLYMER SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-04-27 US disclosed
US-20180030175-A1 POLYMER SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-02-01 US disclosed
US-9217091-B2 Inkjet recording ink and ink cartridge using the ink, inkjet recording apparatus, inkjet recording method and ink recorded matter RICOH COMPANY, LTD. (JP) 2015-12-22 US disclosed
US-20140275401-A1 INKJET RECORDING INK AND INK CARTRIDGE USING THE INK, INKJET RECORDING APPARATUS, INKJET RECORDING METHOD AND INK RECORDED MATTER RICOH COMPANY, LTD. (JP) 2014-09-18 US disclosed
US-7771913-B2 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-10 US disclosed
US-7642034-B2 Photoresists; (meth)acrylate fluoropolymer which is insoluble in water, dissolvable in aqueous alkaline solution, and immiscible with resist films so that it enables pattern formation by the immersion lithography SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-01-05 US disclosed
US-20070231738-A1 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-10-04 US disclosed
US-20070178407-A1 Polymer, resist protective coating material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2007-08-02 US disclosed