SCHEMBL13406717

SCHEMBL13406717

c1ccc(OCCOCCN(CCOCCOc2ccccc2)C2CCCCC2)cc1

nearest known ligand 0.49

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
▸ ALDH1A1 P00352 1/20 0.49
▸ FOXM1 Q08050 1/20 0.45
▸ NPC1 O15118 1/20 0.43
▸ PKM P14618 1/20 0.43
▸ EPHX2 P34913 1/20 0.43
▸ RAB9A P51151 1/20 0.43
▸ SMN1; SMN2 Q16637 1/20 0.43
▸ TSHR P16473 1/20 0.42
▸ KCNA3 P22001 1/20 0.40
▸ ADRB2 P07550 1/20 0.38
▸ ADRB1 P08588 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL23074695 1.00 ALDH1A1 (0.49) ALDH1A1FOXM1NPC1PKMEPHX2
SCHEMBL23074671 0.91 ALDH1A1 (0.53) ALDH1A1NPC1PKMEPHX2RAB9A
SCHEMBL2352960 0.82 ALDH1A1 (0.49) ALDH1A1NPC1PKMEPHX2RAB9A
SCHEMBL13406716 0.75 TSHR (0.60) ALDH1A1TSHRKCNA3ADRB2ADRB1
SCHEMBL23074644 0.75 KDM4E (0.51) ALDH1A1
SCHEMBL23074699 0.75 ALDH1A1 (0.43) ALDH1A1TSHR
SCHEMBL23074697 0.75 HTR2A (0.47) ALDH1A1SMN1; SMN2
SCHEMBL23074662 0.75 LTA4H (0.50) ALDH1A1NPC1PKMEPHX2RAB9A
SCHEMBL23074701 0.75 ALDH1A1 (0.43) ALDH1A1TSHR
SCHEMBL23074677 0.75 HRH3 (0.50) ALDH1A1RAB9ASMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7691560-B2 Resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2010-04-06 — — US disclosed
US-7691560-B2 Resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2010-04-06 — — US disclosed
US-20070224539-A1 Resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2007-09-27 — — US disclosed
US-20070224539-A1 Resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2007-09-27 — — US disclosed
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