SCHEMBL1346949

SCHEMBL1346949

CN(C)CCCc1ccc(C(=O)O)cc1

nearest known ligand 0.61

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
RARB P10826 6/20 0.59
ALDH1A1 P00352 2/20 0.56
MEN1 O00255 1/20 0.56
RARA P10276 1/20 0.56
MAPT P10636 1/20 0.56
MTOR P42345 1/20 0.56
KMT2A Q03164 1/20 0.56
THRA P10827 2/20 0.54
THRB P10828 2/20 0.54
LMNA P02545 1/20 0.53
SIGMAR1 Q99720 1/20 0.52
BCL2 P10415 1/20 0.48
KCNH2 Q12809 1/20 0.47
HSD17B10 Q99714 1/20 0.47
LPAR1 Q92633 1/20 0.46
LPAR5 Q9H1C0 1/20 0.46

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9154546 0.93 SIGMAR1 (0.62) RARBALDH1A1MEN1RARAMAPT
SCHEMBL9638279 0.93 SIGMAR1 (0.62) RARBALDH1A1MEN1RARAMAPT
SCHEMBL4147899 0.93 SIGMAR1 (0.62) RARBALDH1A1MEN1RARAMAPT
SCHEMBL83795 0.89 HRH3 (0.58) RARBALDH1A1MEN1RARAMAPT
Hydrochloric Acid SCHEMBL9315082 0.87 HRH3 (0.56) RARBALDH1A1MEN1RARAMAPT
SCHEMBL9149170 0.85 HSD17B10 (0.61) MAPTKMT2ATHRATHRBLMNA
SCHEMBL11451779 0.84 THRA (0.53) ALDH1A1THRATHRBLMNASIGMAR1
SCHEMBL11249546 0.84 THRA (0.53) THRATHRBLMNASIGMAR1KCNH2
SCHEMBL14558183 0.83 RARB (0.53) RARBALDH1A1MEN1RARAMAPT
SCHEMBL1348794 0.82 RARB (0.60) RARBALDH1A1MEN1RARAMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8063245-B2 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2011-11-22 US disclosed
US-20100218984-A1 PHOTOSENSITIVE DRY FILM RESIST, PRINTED WIRING BOARD MAKING USE OF THE SAME, AND PROCESS FOR PRODUCING PRINTED WIRING BOARD KANEKA CORPORATION (JP) 2010-09-02 US disclosed
US-7396898-B2 Diamine, acid dianhydride, and reactive group containing polyimide composition prepared therefrom and process of preparing them KANEKA CORPORATION (JP) 2008-07-08 US disclosed
US-7189488-B2 Polyimide precursor, manufacturing method thereof, and resin composition using polyimide precursor KANEKA CORPORATION (JP) 2007-03-13 US disclosed
US-7141614-B2 Photosensitive resin composition and photosensitive films and laminates made by using the same KANEKA CORPORATION (JP) 2006-11-28 US disclosed
US-20060199920-A1 Photosensitive resin composition capable of being developed with aqueous developer and photosensitive dry film resist, and use thereof KANEKA CORPORATION (JP) 2006-09-07 US disclosed
US-20060142542-A1 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2006-06-29 US disclosed
US-20040265731-A1 Photosensitive resin composition and photosensitive films and laminates made by using the same KANEKA CORPORATION (JP) 2004-12-30 US disclosed
US-20040235992-A1 Photosensitive resin composition and photosensitive dry film resist and photosensitive coverlay film produced therefrom KANEKA CORPORATION (JP) 2004-11-25 US disclosed
EP-0814109-B1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL CO LTD (JP) 2004-08-18 EP disclosed
US-20040048978-A1 Photosensitive resin composition, solder resist comprising the same, cover lay film, and printed circuit board KANEKA CORPORATION (JP) 2004-03-11 US disclosed
US-6605353-B2 Polyimide derived from a dianhydride and diamine having hydroxyl or carboxyl groups, which are modified with a diepoxide or unsaturated group-containing epoxide; curable; heat resistance, dielectric, film-forming KANEKA CORPORATION (JP) 2003-08-12 US disclosed
US-20030149142-A1 Polyimide precursor, manufacturing method thereof, and resin composition using polyimide precursor KANEKA CORPORATION 2003-08-07 US disclosed
US-20020048726-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 2002-04-25 US disclosed
US-20010056174-A1 Epoxy-modified polyimide, photosensitive composition, coverlay film, solder resist, and printed wiring board using the epoxy-modified polyimide KANEKA CORPORATION (JP) 2001-12-27 US disclosed
US-6319656-B1 FORMING FILM OF A NEGATIVE-WORKING PHOTO-SENSITIVE POLYIMIDE PRECURSOR ON A SUBSTRATE; EXPOSING FILM TO LIGHT THROUGH A MASK HAVING A PREDETERMINED PATTERN; DEVELOPING THE EXPOSED FILM USING AN ALKALINE AQUEOUS SOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2001-11-20 US disclosed
US-6200831-B1 HEAT-CURING A COATING OF A POLYAMIC ACID BASED ON A TETRACARBOXYLIC ACID AND A DIAMINE CONTAINNG AN ACTIVE OXYGEN OR NITROGEN FUNCTIONAL GROUP; SEALING THE EXTERNAL TERMINALS WITH A RESIN, E.G. AN EPOXIDE HITACHI, LTD. (JP) 2001-03-13 US disclosed
US-6087006-A SEMICONDUCTOR DEVICE HAVING SURFACE-PROTECTING FILM COMPRISING POLYIMIDE OBTAINED BY HEAT-CURING PRECURSOR HAVING POLAR SUBSTITUENTS AS THE SIDE CHAINS HITACHI, LTD. (JP) 2000-07-11 US disclosed
US-6025113-A FOR PREPARING HIGHLY SENSITIVE NEGATIVE-WORKING PHOTOSENSITIVE MATERIAL DEVELOPABLE WITH ALKALINE AQUEOUS SOLUTION IN SHORT TIME WITH HIGH RESOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2000-02-15 US disclosed
EP-0814109-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 1997-12-29 EP disclosed