SCHEMBL1348296

SCHEMBL1348296

CC(C)(C)OOc1cccc(C(=O)O)c1[N+](=O)[O-]

nearest known ligand 0.45

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.45
PKM P14618 1/20 0.41
ALDH1A1 P00352 3/20 0.40
HTT P42858 3/20 0.40
CDK2 P24941 1/20 0.40
MAPK1 P28482 1/20 0.39
HPGD P15428 4/20 0.38
KDM4E B2RXH2 3/20 0.38
TDP1 Q9NUW8 3/20 0.38
HSD17B10 Q99714 2/20 0.38
ESR1 P03372 1/20 0.38
ITGB3 P05106 1/20 0.38
ITGA2B P08514 1/20 0.38
HMGB1 P09429 1/20 0.38
GGT1 P19440 1/20 0.38
PTGS1 P23219 1/20 0.38
PTGS2 P35354 1/20 0.38
BLM P54132 1/20 0.38
NAPRT Q6XQN6 1/20 0.38
HPD P32754 4/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1348294 1.00 TSHR (0.45) TSHRPKMALDH1A1HTTCDK2
SCHEMBL104452 0.81 PKM (0.59) TSHRPKMALDH1A1HTTCDK2
SCHEMBL29740471 0.81 PKM (0.59) TSHRPKMALDH1A1HTTCDK2
SCHEMBL7059393 0.80 KDM4E (0.44) TSHRPKMALDH1A1HTTCDK2
SCHEMBL153852 0.79 KDM4E (0.55) TSHRALDH1A1HTTMAPK1HPGD
SCHEMBL346597 0.78 MAPK1 (0.50) TSHRALDH1A1HTTMAPK1HPGD
SCHEMBL1508738 0.78 PTGER1 (0.43) TSHRALDH1A1HTTMAPK1HPGD
SCHEMBL10934705 0.78 HSD17B10 (0.49) TSHRALDH1A1HTTMAPK1HPGD
SCHEMBL2477856 0.78 CA12 (0.46) TSHRALDH1A1HTTMAPK1HPGD
SCHEMBL1348293 0.78 TSHR (0.55) TSHRALDH1A1HTTMAPK1HPGD

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 19 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8063245-B2 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2011-11-22 US disclosed
US-20100218984-A1 PHOTOSENSITIVE DRY FILM RESIST, PRINTED WIRING BOARD MAKING USE OF THE SAME, AND PROCESS FOR PRODUCING PRINTED WIRING BOARD KANEKA CORPORATION (JP) 2010-09-02 US disclosed
US-7396898-B2 Diamine, acid dianhydride, and reactive group containing polyimide composition prepared therefrom and process of preparing them KANEKA CORPORATION (JP) 2008-07-08 US disclosed
US-7189488-B2 Polyimide precursor, manufacturing method thereof, and resin composition using polyimide precursor KANEKA CORPORATION (JP) 2007-03-13 US disclosed
US-7141614-B2 Photosensitive resin composition and photosensitive films and laminates made by using the same KANEKA CORPORATION (JP) 2006-11-28 US disclosed
US-20060199920-A1 Photosensitive resin composition capable of being developed with aqueous developer and photosensitive dry film resist, and use thereof KANEKA CORPORATION (JP) 2006-09-07 US disclosed
US-20060142542-A1 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2006-06-29 US disclosed
EP-0814109-B1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL CO LTD (JP) 2004-08-18 EP disclosed
US-20040158030-A1 Diamine, acid dianhydride, polymide composition having reactive group obtained therefrom, and processes for producing these KANEKA CORPORATION (JP) 2004-08-12 US disclosed
US-20040048978-A1 Photosensitive resin composition, solder resist comprising the same, cover lay film, and printed circuit board KANEKA CORPORATION (JP) 2004-03-11 US disclosed
US-6605353-B2 Polyimide derived from a dianhydride and diamine having hydroxyl or carboxyl groups, which are modified with a diepoxide or unsaturated group-containing epoxide; curable; heat resistance, dielectric, film-forming KANEKA CORPORATION (JP) 2003-08-12 US disclosed
US-20030149142-A1 Polyimide precursor, manufacturing method thereof, and resin composition using polyimide precursor KANEKA CORPORATION 2003-08-07 US disclosed
US-20020048726-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 2002-04-25 US disclosed
US-20010056174-A1 Epoxy-modified polyimide, photosensitive composition, coverlay film, solder resist, and printed wiring board using the epoxy-modified polyimide KANEKA CORPORATION (JP) 2001-12-27 US disclosed
US-6319656-B1 FORMING FILM OF A NEGATIVE-WORKING PHOTO-SENSITIVE POLYIMIDE PRECURSOR ON A SUBSTRATE; EXPOSING FILM TO LIGHT THROUGH A MASK HAVING A PREDETERMINED PATTERN; DEVELOPING THE EXPOSED FILM USING AN ALKALINE AQUEOUS SOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2001-11-20 US disclosed
US-6200831-B1 HEAT-CURING A COATING OF A POLYAMIC ACID BASED ON A TETRACARBOXYLIC ACID AND A DIAMINE CONTAINNG AN ACTIVE OXYGEN OR NITROGEN FUNCTIONAL GROUP; SEALING THE EXTERNAL TERMINALS WITH A RESIN, E.G. AN EPOXIDE HITACHI, LTD. (JP) 2001-03-13 US disclosed
US-6087006-A SEMICONDUCTOR DEVICE HAVING SURFACE-PROTECTING FILM COMPRISING POLYIMIDE OBTAINED BY HEAT-CURING PRECURSOR HAVING POLAR SUBSTITUENTS AS THE SIDE CHAINS HITACHI, LTD. (JP) 2000-07-11 US disclosed
US-6025113-A FOR PREPARING HIGHLY SENSITIVE NEGATIVE-WORKING PHOTOSENSITIVE MATERIAL DEVELOPABLE WITH ALKALINE AQUEOUS SOLUTION IN SHORT TIME WITH HIGH RESOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2000-02-15 US disclosed
EP-0814109-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 1997-12-29 EP disclosed