SCHEMBL13614019

SCHEMBL13614019

CCC(C)(C)C(=O)OC(OC1C2(C)CCC(C2)C1(C)C)C(C)(C)C

nearest known ligand 0.38

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
GPR84 Q9NQS5 1/20 0.38
CYP3A4 P08684 1/20 0.37
CYP2D6 P10635 1/20 0.37
CYP2C9 P11712 1/20 0.37
CYP2C19 P33261 1/20 0.37
TDP1 Q9NUW8 1/20 0.37
CTSV O60911 1/20 0.32
CTSL P07711 1/20 0.32
CTSB P07858 1/20 0.32
CTSS P25774 1/20 0.32
CTSK P43235 1/20 0.32
SCN9A Q15858 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL47433 0.86 GPR84 (0.39) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13614018 0.81 GPR84 (0.35) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13445751 0.81 GPR84 (0.39) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13614014 0.80 GPR84 (0.34) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13614016 0.80 GPR84 (0.34) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL14787816 0.80 CYP3A4 (0.48) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13614024 0.79 GPR84 (0.36) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13614017 0.79 GPR84 (0.34) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL13614015 0.78 GPR84 (0.33) GPR84CYP3A4CYP2D6CYP2C9CYP2C19
SCHEMBL47528 0.76 CYP3A4 (0.42) GPR84CYP3A4CYP2D6CYP2C9CYP2C19

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9746771-B2 Laminate body FUJIFILM CORPORATION (JP) 2017-08-29 US disclosed
US-9448482-B2 Pattern forming method, resist pattern formed by the method, method for manufacturing electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2016-09-20 US disclosed
US-20160170303-A1 LAMINATE BODY FUJIFILM CORPORATION (JP) 2016-06-16 US disclosed
US-20150253673-A1 PATTERN FORMING METHOD, RESIST PATTERN FORMED BY THE METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-09-10 US disclosed
US-20150086912-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND PATTERN FORMING METHOD USING THE SAME, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2015-03-26 US disclosed
US-7611821-B2 Positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-03 US disclosed
US-20080008961-A1 POSITIVE RESIST COMPOSITIONS AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-01-10 US disclosed