SCHEMBL13683084

SCHEMBL13683084

CCC(C)c1ccc(OC(=O)c2cccc3ccccc23)c(Cl)c1

nearest known ligand 0.48

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 3/20 0.48
GAA P10253 2/20 0.48
POLB P06746 1/20 0.48
UTS2R Q9UKP6 1/20 0.44
MAPT P10636 4/20 0.42
HTT P42858 2/20 0.42
CDC25B P30305 2/20 0.41
ADRB2 P07550 1/20 0.41
ADRB1 P08588 1/20 0.41
ADRB3 P13945 1/20 0.41
CNR1 P21554 3/20 0.40
CNR2 P34972 3/20 0.40
ALDH1A1 P00352 4/20 0.40
SMN1; SMN2 Q16637 3/20 0.40
MEN1 O00255 2/20 0.40
CYP2C9 P11712 2/20 0.40
CYP1A2 P05177 1/20 0.40
CYP3A4 P08684 1/20 0.40
ALOX12 P18054 1/20 0.40
CYP2C19 P33261 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13683077 0.87 KMT2A (0.59) KMT2AGAAPOLBUTS2RMAPT
SCHEMBL13683086 0.86 KMT2A (0.50) KMT2AGAAPOLBUTS2RMAPT
SCHEMBL13683087 0.86 GAA (0.60) KMT2AGAAPOLBUTS2RMAPT
SCHEMBL14461704 0.81 HPGD (0.48) KMT2AGAAPOLBUTS2RMAPT
SCHEMBL27640776 0.77 KMT2A (0.59) KMT2AGAAPOLBMAPTHTT
SCHEMBL27450690 0.76 KMT2A (0.69) KMT2AGAAPOLBMAPTHTT
SCHEMBL17424467 0.72 HPGD (0.63) KMT2AGAAPOLBUTS2RMAPT
SCHEMBL31321693 0.71 KMT2A (0.52) KMT2AGAAPOLBCDC25BCNR1
SCHEMBL31321644 0.70 KMT2A (0.64) KMT2AGAAPOLBCDC25BCNR1
SCHEMBL13898473 0.70 HDAC4 (0.43) KMT2AGAAPOLBMAPTHTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7592118-B2 Addition polymer ; insoluble in alkali developer ; acid generator; microlithography, resolution sensitivity, accuracy pattern profile FUJIFILM CORPORATION (JP) 2009-09-22 US disclosed
US-7592118-B2 Addition polymer ; insoluble in alkali developer ; acid generator; microlithography, resolution sensitivity, accuracy pattern profile FUJIFILM CORPORATION (JP) 2009-09-22 US disclosed
US-20080241743-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed
US-20080241743-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed
EP-1975713-A2 Positive resist composition and pattern forming method using the same FUJIFILM Corporation (JP) 2008-10-01 EP disclosed