SCHEMBL15025255

SCHEMBL15025255

CC(=O)OC(COCCN1CCOCC1)CC(F)(F)C(F)(F)CCC(F)(F)CC(F)(F)C(F)(F)F

nearest known ligand 0.34

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 3/20 0.34
ABHD6 Q9BV23 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
ALDH1A1 P00352 2/20 0.31
HPGD P15428 1/20 0.31
OPRM1 P35372 1/20 0.30
KCNH2 Q12809 1/20 0.30
SIGMAR1 Q99720 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15025119 0.93 KDM4E (0.33) KDM4EABHD6SMN1; SMN2ALDH1A1HPGD
SCHEMBL15024850 0.93 KDM4E (0.36) KDM4EABHD6SMN1; SMN2ALDH1A1HPGD
SCHEMBL15024861 0.86 KDM4E (0.37) KDM4EABHD6SMN1; SMN2ALDH1A1HPGD
SCHEMBL4810424 0.86 KDM4E (0.37) KDM4EABHD6SMN1; SMN2ALDH1A1HPGD
SCHEMBL15025396 0.82 USP2 (0.31) ALDH1A1
SCHEMBL15024854 0.76 KDM4E (0.36) KDM4EABHD6SMN1; SMN2ALDH1A1HPGD
SCHEMBL13980440 0.75 ALDH1A1 (0.38) KDM4ESMN1; SMN2ALDH1A1
SCHEMBL15024852 0.75 USP2 (0.31)
SCHEMBL15024853 0.75 TLR2 (0.38) KDM4EABHD6SMN1; SMN2ALDH1A1KCNH2
SCHEMBL15014706 0.75 KDM4E (0.46) KDM4ESMN1; SMN2ALDH1A1HPGDKCNH2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9158191-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-10-13 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed