SCHEMBL15025355

SCHEMBL15025355

OC(CN1CCOCC1)CC(F)(F)CCC(F)(F)C(F)(C(F)(F)F)C(F)(F)F

nearest known ligand 0.50

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
USP2 O75604 2/20 0.50
TSHR P16473 3/20 0.36
ATM Q13315 1/20 0.36
KDM4E B2RXH2 1/20 0.35
L3MBTL1 Q9Y468 2/20 0.35
SMN1; SMN2 Q16637 1/20 0.35
HSD17B10 Q99714 1/20 0.35
CYP2D6 P10635 1/20 0.35
GAA P10253 1/20 0.35
MAPK1 P28482 1/20 0.35
POLB P06746 1/20 0.35
KMT2A Q03164 2/20 0.34
PKM P14618 1/20 0.33
MEN1 O00255 1/20 0.33
ALDH1A1 P00352 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15024836 0.92 USP2 (0.47) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL15025128 0.85 USP2 (0.56) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL15025112 0.84 USP2 (0.49) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL15025100 0.83 ALDH1A1 (0.36) USP2ATMKDM4EKMT2AMEN1
SCHEMBL15025110 0.82 USP2 (0.53) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL15025387 0.82 USP2 (0.46) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL13980438 0.81 USP2 (0.55) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL13985574 0.81 USP2 (0.55) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL4807229 0.79 USP2 (0.56) USP2TSHRATMKDM4EL3MBTL1
SCHEMBL13985580 0.78 USP2 (0.51) USP2TSHRATMKDM4EL3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9158191-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-10-13 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed