SCHEMBL15216263

SCHEMBL15216263

CCC(C)(C)C(=O)OCCC(F)(F)S(=O)(=O)O

nearest known ligand 0.33

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
CYP4F2 P78329 2/20 0.33
CYP4A11 Q02928 2/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10067051 0.90 CYP4F2 (0.35) CYP4F2CYP4A11
SCHEMBL12157326 0.84 CYP4F2 (0.32) CYP4F2CYP4A11
SCHEMBL683677 0.83 CYP4F2 (0.32) CYP4F2CYP4A11
SCHEMBL2740709 0.81 ALDH1A1 (0.36) CYP4F2CYP4A11
SCHEMBL15281556 0.81 CYP4F2 (0.31) CYP4F2CYP4A11
SCHEMBL15275703 0.81
SCHEMBL14649718 0.81 CYP4F2 (0.32) CYP4F2CYP4A11
SCHEMBL9239574 0.80 CYP4F2 (0.38) CYP4F2CYP4A11
SCHEMBL15432458 0.80 CYP4F2 (0.38) CYP4F2CYP4A11
SCHEMBL16706071 0.80 NAAA (0.30)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8957160-B2 Preparation of polymer, resulting polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-02-17 US disclosed
US-8957160-B2 Preparation of polymer, resulting polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-02-17 US disclosed
US-8859194-B2 Polymer compound, and resist-protecting film composition including same for a liquid immersion exposure process DONGJIN SEMICHEM CO., LTD. (KR) 2014-10-14 US disclosed
US-8859194-B2 Polymer compound, and resist-protecting film composition including same for a liquid immersion exposure process DONGJIN SEMICHEM CO., LTD. (KR) 2014-10-14 US disclosed
US-20130252170-A1 Polymer Compound, And Resist-Protecting Film Composition Including Same For A Liquid Immersion Exposure Process DONGJIN SEMICHEM CO., LTD. (KR) 2013-09-26 US disclosed
US-20130252170-A1 Polymer Compound, And Resist-Protecting Film Composition Including Same For A Liquid Immersion Exposure Process DONGJIN SEMICHEM CO., LTD. (KR) 2013-09-26 US disclosed
US-20130224659-A1 POLYMER, MAKING METHOD, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-29 US disclosed
US-20130224660-A1 PREPARATION OF POLYMER, RESULTING POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-29 US disclosed
US-20130224659-A1 POLYMER, MAKING METHOD, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-29 US disclosed
US-20130224660-A1 PREPARATION OF POLYMER, RESULTING POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-29 US disclosed