SCHEMBL15470536

SCHEMBL15470536

C=C(C)C(=O)OCC(=O)OC(C)(C)C1CC=C(C)CC1

nearest known ligand 0.46

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
LMNA P02545 3/20 0.46
CYP3A4 P08684 2/20 0.46
ALOX15 P16050 2/20 0.46
STAT3 P40763 2/20 0.43
MEN1 O00255 1/20 0.43
MAPK1 P28482 1/20 0.43
KMT2A Q03164 1/20 0.43
CHRNA7 P36544 1/20 0.43
PTPN1 P18031 1/20 0.41
ALDH1A1 P00352 2/20 0.33
NPC1 O15118 1/20 0.33
TSHR P16473 1/20 0.33
RAB9A P51151 1/20 0.33
SMN1; SMN2 Q16637 1/20 0.33
CES2 O00748 3/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27843244 0.88 LMNA (0.52) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL15470540 0.86 LMNA (0.51) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL16553105 0.81 LMNA (0.54) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL129843 0.79 LMNA (0.53) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL25380939 0.79 LMNA (0.59) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL15470578 0.79 LMNA (0.42) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL21779540 0.78 LMNA (0.51) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL13398256 0.78 ALDH1A1 (0.38) ALDH1A1TSHR
SCHEMBL18316481 0.78 LMNA (0.60) LMNACYP3A4ALOX15STAT3MEN1
SCHEMBL12663607 0.78 LMNA (0.60) LMNACYP3A4ALOX15STAT3MEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9075308-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US disclosed
US-9075308-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US disclosed
US-20140045122-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed
US-20140045122-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed